一种新的双端口动态RAM故障模型和测试算法

Records of the 1993 IEEE International Workshop on Memory Testing Pub Date : 1993-08-09 DOI:10.1109/MT.1993.263147

V. Castro Alves, O. Kebichi, Á. Ferreira

{"title":"一种新的双端口动态RAM故障模型和测试算法","authors":"V. Castro Alves, O. Kebichi, Á. Ferreira","doi":"10.1109/MT.1993.263147","DOIUrl":null,"url":null,"abstract":"In this paper, the authors present a new class of fault models called duplex pattern sensitive faults that represents more accurately the actual faults that can occur in dual-port DRAMs. Then, they propose an efficient linear test algorithm that allows 100% fault coverage for the considered fault model.<<ETX>>","PeriodicalId":248811,"journal":{"name":"Records of the 1993 IEEE International Workshop on Memory Testing","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A new class of fault models and test algorithms for dual-port dynamic RAM testing\",\"authors\":\"V. Castro Alves, O. Kebichi, Á. Ferreira\",\"doi\":\"10.1109/MT.1993.263147\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, the authors present a new class of fault models called duplex pattern sensitive faults that represents more accurately the actual faults that can occur in dual-port DRAMs. Then, they propose an efficient linear test algorithm that allows 100% fault coverage for the considered fault model.<<ETX>>\",\"PeriodicalId\":248811,\"journal\":{\"name\":\"Records of the 1993 IEEE International Workshop on Memory Testing\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-08-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Records of the 1993 IEEE International Workshop on Memory Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MT.1993.263147\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Records of the 1993 IEEE International Workshop on Memory Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MT.1993.263147","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

在本文中，作者提出了一类新的故障模型，称为双工模式敏感故障，它更准确地代表了双端口dram中可能发生的实际故障。然后，他们提出了一种有效的线性测试算法，该算法允许所考虑的故障模型100%的故障覆盖率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

A new class of fault models and test algorithms for dual-port dynamic RAM testing

In this paper, the authors present a new class of fault models called duplex pattern sensitive faults that represents more accurately the actual faults that can occur in dual-port DRAMs. Then, they propose an efficient linear test algorithm that allows 100% fault coverage for the considered fault model.<>

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Records of the 1993 IEEE International Workshop on Memory Testing

自引率

0.00%

发文量