{"title":"新型半透明非晶硅传感器[位置传感器]表征的初步结果","authors":"A. Calderon, A. Virto, J. Luque","doi":"10.1109/IMTC.2004.1351235","DOIUrl":null,"url":null,"abstract":"We present first results on the performance of a new generation of semitransparent amorphous silicon position detectors having very good properties such as a precision better than 5 /spl mu/m, deflection angles smaller than 10 /spl mu/rad and transmission in the visible higher than 70%. In addition the sensitive area is very large: 30/spl times/30 cm/sup 2/.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"First results on the characterization of new semitransparent amorphous silicon sensors [position sensors]\",\"authors\":\"A. Calderon, A. Virto, J. Luque\",\"doi\":\"10.1109/IMTC.2004.1351235\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present first results on the performance of a new generation of semitransparent amorphous silicon position detectors having very good properties such as a precision better than 5 /spl mu/m, deflection angles smaller than 10 /spl mu/rad and transmission in the visible higher than 70%. In addition the sensitive area is very large: 30/spl times/30 cm/sup 2/.\",\"PeriodicalId\":386903,\"journal\":{\"name\":\"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-05-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2004.1351235\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2004.1351235","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
First results on the characterization of new semitransparent amorphous silicon sensors [position sensors]
We present first results on the performance of a new generation of semitransparent amorphous silicon position detectors having very good properties such as a precision better than 5 /spl mu/m, deflection angles smaller than 10 /spl mu/rad and transmission in the visible higher than 70%. In addition the sensitive area is very large: 30/spl times/30 cm/sup 2/.