凹槽栅AlN/β-Ga2O3 HEMT的高性能分析

Tushar Shivam, B. Saini, R. K. Sunkaria, Ravi Ranjan
{"title":"凹槽栅AlN/β-Ga2O3 HEMT的高性能分析","authors":"Tushar Shivam, B. Saini, R. K. Sunkaria, Ravi Ranjan","doi":"10.1109/ICECCT52121.2021.9616693","DOIUrl":null,"url":null,"abstract":"Normally-OFF HEMT is used for power electronics application. The proposed Recessed gate AlN/β-Ga<inf>2</inf>O<inf>3</inf> HEMT (RG-AlN/β-Ga<inf>2</inf>O<inf>3</inf> HEMT) is enhance the performance of device. In this paper analog performance of the RG-AlN/β-Ga<inf>2</inf>O<inf>3</inf> HEMT is analysis. Due to larger bandgap of β-Ga<inf>2</inf>O<inf>3</inf>, the proposed device will work for larger breakdown voltage. Two-dimensional electron gas (2DEG) is formed at the top of β-Ga<inf>2</inf>O<inf>3</inf> with polarization induced field in AlN layer. No any doping is required in any layer to generate 2DEG. Dual layer of dielectric is used for enhance the analog performance and also interface quality of proposed device. Drain current (Ids), transconductance (g<inf>m</inf>), total gate capacitance (C<inf>gg</inf>) and cutoff frequency(f<inf>T</inf>) are analysis.","PeriodicalId":155129,"journal":{"name":"2021 Fourth International Conference on Electrical, Computer and Communication Technologies (ICECCT)","volume":"194 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High-Performance Analysis of Recessed Gate AlN/β-Ga2O3 HEMT\",\"authors\":\"Tushar Shivam, B. Saini, R. K. Sunkaria, Ravi Ranjan\",\"doi\":\"10.1109/ICECCT52121.2021.9616693\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Normally-OFF HEMT is used for power electronics application. The proposed Recessed gate AlN/β-Ga<inf>2</inf>O<inf>3</inf> HEMT (RG-AlN/β-Ga<inf>2</inf>O<inf>3</inf> HEMT) is enhance the performance of device. In this paper analog performance of the RG-AlN/β-Ga<inf>2</inf>O<inf>3</inf> HEMT is analysis. Due to larger bandgap of β-Ga<inf>2</inf>O<inf>3</inf>, the proposed device will work for larger breakdown voltage. Two-dimensional electron gas (2DEG) is formed at the top of β-Ga<inf>2</inf>O<inf>3</inf> with polarization induced field in AlN layer. No any doping is required in any layer to generate 2DEG. Dual layer of dielectric is used for enhance the analog performance and also interface quality of proposed device. Drain current (Ids), transconductance (g<inf>m</inf>), total gate capacitance (C<inf>gg</inf>) and cutoff frequency(f<inf>T</inf>) are analysis.\",\"PeriodicalId\":155129,\"journal\":{\"name\":\"2021 Fourth International Conference on Electrical, Computer and Communication Technologies (ICECCT)\",\"volume\":\"194 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-09-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 Fourth International Conference on Electrical, Computer and Communication Technologies (ICECCT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICECCT52121.2021.9616693\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 Fourth International Conference on Electrical, Computer and Communication Technologies (ICECCT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECCT52121.2021.9616693","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

常关HEMT用于电力电子应用。提出的嵌入式栅极AlN/β-Ga2O3 HEMT (RG-AlN/β-Ga2O3 HEMT)可以提高器件的性能。本文分析了RG-AlN/β-Ga2O3 HEMT的模拟性能。由于β-Ga2O3的带隙较大,该器件可以在较大的击穿电压下工作。在AlN层的极化诱导场作用下,β-Ga2O3顶部形成二维电子气(2DEG)。在任何层中都不需要任何掺杂来产生2DEG。采用双介质层提高了模拟性能,同时提高了器件的接口质量。分析漏极电流(Ids)、跨导(gm)、总栅极电容(Cgg)和截止频率(fT)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High-Performance Analysis of Recessed Gate AlN/β-Ga2O3 HEMT
Normally-OFF HEMT is used for power electronics application. The proposed Recessed gate AlN/β-Ga2O3 HEMT (RG-AlN/β-Ga2O3 HEMT) is enhance the performance of device. In this paper analog performance of the RG-AlN/β-Ga2O3 HEMT is analysis. Due to larger bandgap of β-Ga2O3, the proposed device will work for larger breakdown voltage. Two-dimensional electron gas (2DEG) is formed at the top of β-Ga2O3 with polarization induced field in AlN layer. No any doping is required in any layer to generate 2DEG. Dual layer of dielectric is used for enhance the analog performance and also interface quality of proposed device. Drain current (Ids), transconductance (gm), total gate capacitance (Cgg) and cutoff frequency(fT) are analysis.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信