通过最小化表面声子散射提高石墨烯-场效应管沟道迁移率-模拟研究

Xinxin Yu, Jiahao Kang, Jinyu Zhang, L. Tian, Zhiping Yu
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引用次数: 0

摘要

在石墨烯基场效应晶体管(graphene fet)中,载流子通道迁移率受到衬底和栅极介电材料的强烈影响。本文从理论上研究了石墨烯-场效应管的载流子通道迁移率。在迁移率计算中考虑了表面声子(SP)散射、屏蔽库仑散射、声子和光声子散射机制。应用Mahan理论,对栅极堆叠结构中的SP散射进行了计算。发现SP散射在高k介电介质中起着重要的作用。通过在栅极电介质和石墨烯之间插入聚合物层,可以有效地抑制带电杂质和SP散射。然而,聚合物层的厚度应仔细选择,以平衡通道载流子迁移率增强和栅极控制能力。我们的计算结果与前人的计算和实验观察结果是一致的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improving channel mobility in graphene-FETs by minimizing surface phonon scattering - A simulation study
In graphene-based field-effect transistors (graphene FETs), the carrier channel mobility is strongly influenced by substrate and gate dielectric materials. In this paper, we theoretically investigated the carrier channel mobility for the graphene-FET. Surface phonon (SP) scattering, screened Coulomb scattering, acoustic phonon and optical phonon scattering mechanisms are considered in the mobility calculation. Applying Mahan's theory, the SP scattering in a gate stack structure is evaluated. It is found that SP scattering plays an important role especially in high-k dielectrics. The charged impurity and SP scattering can be suppressed effectively by inserting a polymer layer between the gate dielectric and graphene. The thickness of the ploymer layer, however, should be carefully selected to balance the channel carrier mobility enhancement and gate control ability. Our calculation results are consistent with previous calculations and experimental observations.
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