{"title":"充当LXI仪器的子系统","authors":"Brandon Thorpe","doi":"10.1109/AUTEST.2011.6058743","DOIUrl":null,"url":null,"abstract":"This paper describes an intelligent subsystem that integrates into a larger test system as if it were a single complex instrument. Actually, the subsystem contains a controlling embedded PC and various instruments that conform to the PXIe test standard working in tight coordination to perform complex tasks. The test station computer communicates with the subsystem with a high-level IVI driver via Ethernet.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"155 ","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A subsystem that behaves as an LXI instrument\",\"authors\":\"Brandon Thorpe\",\"doi\":\"10.1109/AUTEST.2011.6058743\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes an intelligent subsystem that integrates into a larger test system as if it were a single complex instrument. Actually, the subsystem contains a controlling embedded PC and various instruments that conform to the PXIe test standard working in tight coordination to perform complex tasks. The test station computer communicates with the subsystem with a high-level IVI driver via Ethernet.\",\"PeriodicalId\":110721,\"journal\":{\"name\":\"2011 IEEE AUTOTESTCON\",\"volume\":\"155 \",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2011.6058743\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2011.6058743","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper describes an intelligent subsystem that integrates into a larger test system as if it were a single complex instrument. Actually, the subsystem contains a controlling embedded PC and various instruments that conform to the PXIe test standard working in tight coordination to perform complex tasks. The test station computer communicates with the subsystem with a high-level IVI driver via Ethernet.