{"title":"红外光源非线性增益系数的测定","authors":"V. Lysak, I. Sukhoivanov","doi":"10.1109/LFNM.2000.854040","DOIUrl":null,"url":null,"abstract":"The influence of electron concentration on optical gain of a semiconductor lasers is analyzed. The comparison by an integrated gain model and approached models for a range of active layer thickness change from 50 up to 1000 /spl Aring/ was carried out. The expression of the approximation model parameter change from the active layer thickness is determined.","PeriodicalId":265943,"journal":{"name":"Proceedings of LFNM'2000. 2nd International Workshop on Laser and Fiber-Optical Networks Modeling (Cat. No.00EX419)","volume":"143 ","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Determination of nonlinear gain coefficients for infrared optical sources\",\"authors\":\"V. Lysak, I. Sukhoivanov\",\"doi\":\"10.1109/LFNM.2000.854040\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The influence of electron concentration on optical gain of a semiconductor lasers is analyzed. The comparison by an integrated gain model and approached models for a range of active layer thickness change from 50 up to 1000 /spl Aring/ was carried out. The expression of the approximation model parameter change from the active layer thickness is determined.\",\"PeriodicalId\":265943,\"journal\":{\"name\":\"Proceedings of LFNM'2000. 2nd International Workshop on Laser and Fiber-Optical Networks Modeling (Cat. No.00EX419)\",\"volume\":\"143 \",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of LFNM'2000. 2nd International Workshop on Laser and Fiber-Optical Networks Modeling (Cat. No.00EX419)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LFNM.2000.854040\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of LFNM'2000. 2nd International Workshop on Laser and Fiber-Optical Networks Modeling (Cat. No.00EX419)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LFNM.2000.854040","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Determination of nonlinear gain coefficients for infrared optical sources
The influence of electron concentration on optical gain of a semiconductor lasers is analyzed. The comparison by an integrated gain model and approached models for a range of active layer thickness change from 50 up to 1000 /spl Aring/ was carried out. The expression of the approximation model parameter change from the active layer thickness is determined.