{"title":"时钟域验证挑战和可扩展的解决方案","authors":"P. Ashar","doi":"10.1109/HLDVT.2010.5496661","DOIUrl":null,"url":null,"abstract":"With chip-design risk at worrying levels, a verification methodology based on just linting and simulation does not cut it. Real Intent has demonstrated that identifying specific sources of verification complexity and deploying automatic customized technologies to tackle them surgically has benefit. Automatic and customized don't go together at first glance. Whereas automatic deals with maximizing productivity in setup, analysis and debug, customized ensures comprehensiveness. That's the challenge for clock-domain verification as well as for the plethora of other failure modes in modern chips. Clock-domain verification is certainly a case in point. Its complexity has grown tremendously:","PeriodicalId":200068,"journal":{"name":"2010 IEEE International High Level Design Validation and Test Workshop (HLDVT)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Clock domain verification challenges and scalable solutions\",\"authors\":\"P. Ashar\",\"doi\":\"10.1109/HLDVT.2010.5496661\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With chip-design risk at worrying levels, a verification methodology based on just linting and simulation does not cut it. Real Intent has demonstrated that identifying specific sources of verification complexity and deploying automatic customized technologies to tackle them surgically has benefit. Automatic and customized don't go together at first glance. Whereas automatic deals with maximizing productivity in setup, analysis and debug, customized ensures comprehensiveness. That's the challenge for clock-domain verification as well as for the plethora of other failure modes in modern chips. Clock-domain verification is certainly a case in point. Its complexity has grown tremendously:\",\"PeriodicalId\":200068,\"journal\":{\"name\":\"2010 IEEE International High Level Design Validation and Test Workshop (HLDVT)\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-06-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International High Level Design Validation and Test Workshop (HLDVT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HLDVT.2010.5496661\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International High Level Design Validation and Test Workshop (HLDVT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HLDVT.2010.5496661","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Clock domain verification challenges and scalable solutions
With chip-design risk at worrying levels, a verification methodology based on just linting and simulation does not cut it. Real Intent has demonstrated that identifying specific sources of verification complexity and deploying automatic customized technologies to tackle them surgically has benefit. Automatic and customized don't go together at first glance. Whereas automatic deals with maximizing productivity in setup, analysis and debug, customized ensures comprehensiveness. That's the challenge for clock-domain verification as well as for the plethora of other failure modes in modern chips. Clock-domain verification is certainly a case in point. Its complexity has grown tremendously: