{"title":"在数字示波器中执行自动测试的专家系统","authors":"G. D'Antona, A. Gandelli","doi":"10.1109/IMTC.1991.161537","DOIUrl":null,"url":null,"abstract":"The design and realization of an expert system devoted to digital oscilloscope testing are presented. High-level features can be added to classical automatic testing equipment to obtain versatile and efficient systems providing significant accuracy in the evaluation of hardware and software performances of these digital instruments. Simple operative procedures and limited costs allow the introduction of this equipment for industrial testing purposes.<<ETX>>","PeriodicalId":439545,"journal":{"name":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Expert system performing automatic testing in digital oscilloscopes\",\"authors\":\"G. D'Antona, A. Gandelli\",\"doi\":\"10.1109/IMTC.1991.161537\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The design and realization of an expert system devoted to digital oscilloscope testing are presented. High-level features can be added to classical automatic testing equipment to obtain versatile and efficient systems providing significant accuracy in the evaluation of hardware and software performances of these digital instruments. Simple operative procedures and limited costs allow the introduction of this equipment for industrial testing purposes.<<ETX>>\",\"PeriodicalId\":439545,\"journal\":{\"name\":\"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1991.161537\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1991.161537","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Expert system performing automatic testing in digital oscilloscopes
The design and realization of an expert system devoted to digital oscilloscope testing are presented. High-level features can be added to classical automatic testing equipment to obtain versatile and efficient systems providing significant accuracy in the evaluation of hardware and software performances of these digital instruments. Simple operative procedures and limited costs allow the introduction of this equipment for industrial testing purposes.<>