有机FC-BGA封装的高级表面电镀

Y. Tomia, Qiang Wu, A. Maeda, S. Baba, N. Ueda
{"title":"有机FC-BGA封装的高级表面电镀","authors":"Y. Tomia, Qiang Wu, A. Maeda, S. Baba, N. Ueda","doi":"10.1109/ECTC.2000.853263","DOIUrl":null,"url":null,"abstract":"Electric components and devices have become high density more and more because of demands for high performance. Nowadays, electroless surface plating is often applied to the surface finish of substrate land patterns for soldering and interconnections due to the enhancement of the wiring design on the mounting hoard, which leads to the shrinkage of the devices. In some cases, though, electroless plating causes weak solder joints on the external terminals of electric devices and packages. The key issue on the developed organic FC-BGA (Flip-chip Ball Grid Array) packaging process is to achieve the ball attach strength on the substrate lands with electroless nickel and immersion gold plating. It was confirmed that the root cause of the weak strength was the existence of the phosphoric enrichment layer with the detailed analysis. Additionally, regarding with the new approach to solve the weak solder joint, the DCNP (double-layered constructed nickel plating) was effective in preventing the progress of the phosphoric enrichment layer.","PeriodicalId":410140,"journal":{"name":"2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070)","volume":"329 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Advanced surface plating on the organic FC-BGA package\",\"authors\":\"Y. Tomia, Qiang Wu, A. Maeda, S. Baba, N. Ueda\",\"doi\":\"10.1109/ECTC.2000.853263\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electric components and devices have become high density more and more because of demands for high performance. Nowadays, electroless surface plating is often applied to the surface finish of substrate land patterns for soldering and interconnections due to the enhancement of the wiring design on the mounting hoard, which leads to the shrinkage of the devices. In some cases, though, electroless plating causes weak solder joints on the external terminals of electric devices and packages. The key issue on the developed organic FC-BGA (Flip-chip Ball Grid Array) packaging process is to achieve the ball attach strength on the substrate lands with electroless nickel and immersion gold plating. It was confirmed that the root cause of the weak strength was the existence of the phosphoric enrichment layer with the detailed analysis. Additionally, regarding with the new approach to solve the weak solder joint, the DCNP (double-layered constructed nickel plating) was effective in preventing the progress of the phosphoric enrichment layer.\",\"PeriodicalId\":410140,\"journal\":{\"name\":\"2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070)\",\"volume\":\"329 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.2000.853263\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2000.853263","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

摘要

由于对高性能的要求,电子元件和器件的密度越来越高。目前,由于安装层上的布线设计的提高,导致器件的收缩,化学表面镀常用于焊接和互连的基板表面处理。然而,在某些情况下,化学镀会导致电子设备和封装外部端子上的焊点薄弱。开发的有机FC-BGA(倒装芯片球栅阵列)封装工艺的关键问题是通过化学镀镍和浸金来实现球在衬底上的附着强度。通过详细分析,确定了强度弱的根本原因是磷富集层的存在。此外,对于解决薄弱焊点的新方法,DCNP(双层结构镀镍)可以有效地阻止磷富集层的进展。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Advanced surface plating on the organic FC-BGA package
Electric components and devices have become high density more and more because of demands for high performance. Nowadays, electroless surface plating is often applied to the surface finish of substrate land patterns for soldering and interconnections due to the enhancement of the wiring design on the mounting hoard, which leads to the shrinkage of the devices. In some cases, though, electroless plating causes weak solder joints on the external terminals of electric devices and packages. The key issue on the developed organic FC-BGA (Flip-chip Ball Grid Array) packaging process is to achieve the ball attach strength on the substrate lands with electroless nickel and immersion gold plating. It was confirmed that the root cause of the weak strength was the existence of the phosphoric enrichment layer with the detailed analysis. Additionally, regarding with the new approach to solve the weak solder joint, the DCNP (double-layered constructed nickel plating) was effective in preventing the progress of the phosphoric enrichment layer.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信