Sangick Lee, Seokwoo Kang, Taewon Kim, Seungsoo Lee, Mabae Kim
{"title":"利用VMD和深度神经网络提高串行电弧检测性能","authors":"Sangick Lee, Seokwoo Kang, Taewon Kim, Seungsoo Lee, Mabae Kim","doi":"10.1109/MWSCAS.2019.8885020","DOIUrl":null,"url":null,"abstract":"Serial arc is one of factors causing electrical fires. Over the past decades, a variety of researches have been carried out to detect arc signals using frequency characteristics, wavelet analysis and statistical features. However, the usage of those features has shown low arc-detection performance. To solve this, we employ variational mode decomposition (VMD) to generate more time-domain signals, from which statistical features are computed from VMD mode signals, providing more informative features. Using a deep neural network (DNN) as an arc classifier, experiments validate that the VMD could improve the arc-detection performance by 4 percent.","PeriodicalId":287815,"journal":{"name":"2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Improving the Performance of Serial Arc Detection using VMD and Deep Neural Network\",\"authors\":\"Sangick Lee, Seokwoo Kang, Taewon Kim, Seungsoo Lee, Mabae Kim\",\"doi\":\"10.1109/MWSCAS.2019.8885020\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Serial arc is one of factors causing electrical fires. Over the past decades, a variety of researches have been carried out to detect arc signals using frequency characteristics, wavelet analysis and statistical features. However, the usage of those features has shown low arc-detection performance. To solve this, we employ variational mode decomposition (VMD) to generate more time-domain signals, from which statistical features are computed from VMD mode signals, providing more informative features. Using a deep neural network (DNN) as an arc classifier, experiments validate that the VMD could improve the arc-detection performance by 4 percent.\",\"PeriodicalId\":287815,\"journal\":{\"name\":\"2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSCAS.2019.8885020\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2019.8885020","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improving the Performance of Serial Arc Detection using VMD and Deep Neural Network
Serial arc is one of factors causing electrical fires. Over the past decades, a variety of researches have been carried out to detect arc signals using frequency characteristics, wavelet analysis and statistical features. However, the usage of those features has shown low arc-detection performance. To solve this, we employ variational mode decomposition (VMD) to generate more time-domain signals, from which statistical features are computed from VMD mode signals, providing more informative features. Using a deep neural network (DNN) as an arc classifier, experiments validate that the VMD could improve the arc-detection performance by 4 percent.