用于检测光点位置应用的CMOS单片校准位置敏感检测器(PSD)

C. Chiang, Yu-Ting Hou
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引用次数: 6

摘要

本文提出了一种用于光点位置检测的CMOS单片校准位置敏感探测器(PSD)。本文提出了一种校正技术。通过校准电路,该芯片成功地检测了真实环境中小光源的位置。在执行所提出的校准电路之前,最大线性误差为54.55%。校准后,最大线性误差可降至3%。一个光点的光动态范围为40db。芯片面积为2.87 × 2.72 mm2。该芯片适用于光斑位置测量器件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A CMOS monolithic calibrated position-sensitive detector (PSD) for detecting light-spot position applications
In this paper, a CMOS monolithic calibrated position-sensitive detector (PSD) for detecting light-spot position applications is newly proposed. A calibration technique is proposed in this work. With the calibration circuits, the proposed chip successfully detects the position of a small light in a real environment. Before performing the proposed calibration circuits, the maximum linear error is 54.55%. After calibration, the maximum linear error can be reduced to 3%. The light dynamic range of a light spot is 40 dB. The chip area is 2.87 × 2.72 mm2. The proposed chip is suitable for devices of measuring light-spot position.
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