器件性能的有机晶体管技术选择与箔上提高电路可靠性和良率的技术选择

Jan Genoe, K. Myny, S. Steudel, S. Smout, P. Vicca, B. van der Putten, A. Tripathi, N. V. van Aerle, G. Gelinck, W. Dehaene, P. Heremans
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引用次数: 0

摘要

去年,有机器件技术的进步(如器件缩放、高k介电体[1]等)使性能取得了实质性进展。这导致塑料应答器电路的数据速率从大约2 kbit/s[2]增加到epc兼容的速度(50 kbit/s)。从溶液中沉积的有机半导体并五苯被性能更好的气相沉积的并五苯所取代,迁移率提高了3倍。在这种新工艺中,并五烯晶体管的隔离是通过集成阴影掩膜实现的,如图1所示,其结果是半导体区域的可靠隔离,断开电流低于10pA。我们用100 nm厚的高k电介质(溅射Al2O3)取代了有机聚合物(低k)电介质,导致比积累电容提高了8倍。这反过来又允许将晶体管通道长度从5µm缩小到2µm,同时在饱和状态下保持高输出电阻-因此也具有高逆变器增益和噪声裕度。该流程的横截面如图1所示。图2显示了在速度优化的箔上实现的5级环形振荡器的显微图像。这种有机薄膜电路技术允许设计具有较低的重叠电容并缩小晶体管通道长度,在现有高通量制造工具(例如背板制造中使用的步进器)可实现的范围内。在这项工作中,我们改变了电路中TFTs的通道长度(L)在20µm和2µm之间,并通过减少完全重叠栅极的指形源极和漏极触点的宽度(从5µm到2µm)来限制栅极-源极和栅极-漏极重叠电容。图2显示了一个晶体管的显微图像。图3和图4分别描述了用该技术制造的L = 5µm和2µm的晶体管的典型转移曲线。晶体管正常工作,其载流子(空穴)迁移率超过0.5cm2/Vs。图5显示了通道长度为5µm和2µm的零负载逆变器的典型传输曲线。驱动晶体管与负载晶体管的比例为10∶1。逆变器具有高增益和噪声裕度。在这种技术中,逆变器的级延迟(τD)如图6所示为电源电压的函数。级延迟由19级环形振荡器确定。图中显示了通道长度为20µm至2µm,晶体管指间栅极重叠为5µm至2µm的逆变器的τD。级延迟低于1µs,低至400ns,显示在VDD=10V。据我们所知,在此之前还没有一种塑料技术能在如此低的电压下实现如此快的速度。减小重叠电容的效果也显示在两个较小的通道长度上:将重叠从5µm缩小到2µm,将级延迟提高了1.5到2倍。我们继续设计和实现了8位有机RFID应答器芯片,通道长度为2微米,手指宽度为5微米或2微米。图7和8显示了6″晶片的照片和芯片的变焦,图9显示了相应的原理图。图11描述了两种应答器的输出信号。与2µm手指的逆变器级延迟快两倍一致,该应答器的数据速率也是5µm手指设计的两倍。在信道长度为2µm的8bit应答器中,获得的数据速率达到了创纪录的50kb/s。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Organic transistor technology options for device performance versus technology options for increased circuit reliability and yield on foil
Last year, advances in organic device technology (such as device scaling, high K-dielectrics [1], … ) enabled a substantial progress in performance. This resulted in an increase in the data rate of plastic transponder circuits from about 2 kbit/s [2] to EPC-compatible speeds (50 kbit/s). The organic semiconductor pentacene deposited from solution was replaced by a better-performing vapor-phase deposited pentacene, with a mobility being a factor of 3 higher. The isolation of pentacene transistors in this new process is achieved by an integrated shadow mask, shown in Fig. 1, that results in a reliable isolation of the semiconductor area testified by off-currents below 10pA. We replaced the organic polymer (low-k) dielectric with a 100-nm thick high-k dielectric, sputtered Al2O3, resulting in an 8-fold higher specific accumulation capacitance. That, in turn, allowed for downscaling the transistor channel length from 5µm to 2µm, while maintaining a high output resistance in saturation - and therefore also high inverter gain and noise margins. A cross-section of this process flow is depicted in Fig. 1. Fig. 2 shows a micrograph image of a 5-stage ring oscillator realized in this technology on foil optimized for speed. This organic thin-film circuit technology allows to design with lower overlap capacitance and to downscale the transistor channel length, within the boundaries achievable by existing high-throughput manufacturing tools (e.g. steppers used in backplane manufacturing). In this work, we varied the channel lengths (L) of the TFTs in the circuits between 20µm and 2µm and limited the gate-source and gate-drain overlap capacitances by decreasing the width of the finger-shaped source and drain contacts, that fully overlap the gate, from 5µm to 2µm. Fig. 2 shows a micrograph image of one transistor. Typical transfer curves of transistors fabricated in this technology, having L = 5µm and 2µm, are depicted in Fig. 3 and Fig. 4 respectively. The transistors are normally-on and their charge carrier (hole) mobility exceeds 0.5cm2/Vs. Fig. 5 shows typical transfer curves of a zerovgs-load inverters with channel lengths of 5µm and 2µm. The ratio between drive and load transistor is 10∶1. The inverters have high gains and noise margins. The stage delay (τD) of inverters in this technology is plotted as a function of the supply voltage in Fig. 6. The stage delay is determined from 19-stage ring oscillators. The figure shows τD for inverters with channel lengths from 20µm to 2µm and gate-overlap of the transistor-fingers ranging from 5µm to 2µm. Stage delays below 1µs, and as low as 400ns, are shown at VDD=10V. To our knowledge, no plastic technology was shown before with such speeds at these low power voltages. The effect of decreasing the overlap capacitance is also shown for the two smaller channel lengths: shrinking the overlap from 5µm to 2µm improves the stage delay by a factor of 1.5 to 2. We proceeded with the design and realization of 8bit organic RFID transponder chips, having a channel length of 2µm and either 5µm or 2µm finger widths. Figs. 7 and 8 show the photographs of the 6″ wafer and a zoom of the die, Fig. 9 shows the corresponding schematic. Fig. 11 depicts the output signal of both types of transponders. In agreement with the two-fold faster inverter stage delay for the 2µm fingers, the data rate of this transponder is also twice as high as that of the design with 5µm fingers. The obtained data rate of the 8bit transponder with channel length and fingers of 2µm is a record 50kb/s.
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