{"title":"基于Sn/sub 62/Pb/sub 36/Ag/sub 2/合金冶金行为的软焊点寿命评估","authors":"G. Grossmann, L. Weber","doi":"10.1109/IEMT.1997.626927","DOIUrl":null,"url":null,"abstract":"The introduction of new packages as well as the ongoing miniaturisation in SMT make the evaluation of the reliability of solder joints a permanent task. Passive thermal cycling is an important test to evaluate the lifetime of solder joints. However, tin-lead solder behaves viscoplastically. Therefore it is mandatory to take the metallurgical behaviour of the solder into account when accelerated tests are designed. Two different deformation mechanisms occur, depending on the temperatures of the test as well as the temperature gradient: grain boundary sliding (GBS) and dislocation climb (DC). Therefore, one is not free in choosing the parameters of a test cycle because test parameters (temperature ramp, dwell time) have a major influence on the growth of cracks. Furthermore the stress under service conditions must be taken into account.","PeriodicalId":227971,"journal":{"name":"Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Lifetime assessment of soft solder joints on the base of the metallurgical behaviour of Sn/sub 62/Pb/sub 36/Ag/sub 2/\",\"authors\":\"G. Grossmann, L. Weber\",\"doi\":\"10.1109/IEMT.1997.626927\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The introduction of new packages as well as the ongoing miniaturisation in SMT make the evaluation of the reliability of solder joints a permanent task. Passive thermal cycling is an important test to evaluate the lifetime of solder joints. However, tin-lead solder behaves viscoplastically. Therefore it is mandatory to take the metallurgical behaviour of the solder into account when accelerated tests are designed. Two different deformation mechanisms occur, depending on the temperatures of the test as well as the temperature gradient: grain boundary sliding (GBS) and dislocation climb (DC). Therefore, one is not free in choosing the parameters of a test cycle because test parameters (temperature ramp, dwell time) have a major influence on the growth of cracks. Furthermore the stress under service conditions must be taken into account.\",\"PeriodicalId\":227971,\"journal\":{\"name\":\"Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-10-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1997.626927\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1997.626927","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Lifetime assessment of soft solder joints on the base of the metallurgical behaviour of Sn/sub 62/Pb/sub 36/Ag/sub 2/
The introduction of new packages as well as the ongoing miniaturisation in SMT make the evaluation of the reliability of solder joints a permanent task. Passive thermal cycling is an important test to evaluate the lifetime of solder joints. However, tin-lead solder behaves viscoplastically. Therefore it is mandatory to take the metallurgical behaviour of the solder into account when accelerated tests are designed. Two different deformation mechanisms occur, depending on the temperatures of the test as well as the temperature gradient: grain boundary sliding (GBS) and dislocation climb (DC). Therefore, one is not free in choosing the parameters of a test cycle because test parameters (temperature ramp, dwell time) have a major influence on the growth of cracks. Furthermore the stress under service conditions must be taken into account.