控制初始层为低温高沉积速率多晶硅薄膜的形成过程

K. Murata, M. Hori, T. Goto
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摘要

在本研究中,两步生长(TSG)法可以同时满足薄界面层、高结晶度和高沉积速率的要求。在TSG中,首先形成的种子层没有带电种,即有中性种。然后,在带电荷的种子层上生长多晶硅膜。讨论了离子轰击对多晶硅薄膜生长初期成核的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Control of initial layer for low temperature and high deposition rate polycrystalline silicon film formation process
In this study, the two step growth (TSG) method has been demonstrated to satisfy thin interface layer, the high crystallinity and high deposition rate of poly-Si film, at the same time. In the TSG, firstly the seed layer was formed without charged species, that is, with neutral species. Then, the poly-Si film was subsequently grown on the seed layer with charged species. The effects of ion bombardment on the nucleation of poly-Si films at the initial growth stage are intensively discussed.
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