{"title":"流行的软件缺陷模型的实用性","authors":"P. Hartman","doi":"10.1109/RAMS.2002.981659","DOIUrl":null,"url":null,"abstract":"Numerical models can be used to track and predict the number of defects in developmental and operational software. This paper introduces techniques to critically assess the effectiveness of software defect reduction efforts as the data is being gathered. This can be achieved by observing the fundamental shape of the cumulative defect discovery curves and by judging how quickly the various defect models converge to common predictions of long term software performance.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Utility of popular software defect models\",\"authors\":\"P. Hartman\",\"doi\":\"10.1109/RAMS.2002.981659\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Numerical models can be used to track and predict the number of defects in developmental and operational software. This paper introduces techniques to critically assess the effectiveness of software defect reduction efforts as the data is being gathered. This can be achieved by observing the fundamental shape of the cumulative defect discovery curves and by judging how quickly the various defect models converge to common predictions of long term software performance.\",\"PeriodicalId\":395613,\"journal\":{\"name\":\"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)\",\"volume\":\"68 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RAMS.2002.981659\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.2002.981659","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Numerical models can be used to track and predict the number of defects in developmental and operational software. This paper introduces techniques to critically assess the effectiveness of software defect reduction efforts as the data is being gathered. This can be achieved by observing the fundamental shape of the cumulative defect discovery curves and by judging how quickly the various defect models converge to common predictions of long term software performance.