{"title":"测试输出中的错误定位:签名压缩的广义分析","authors":"S. Demidenko, V. Piuri, A. Ivaniukovich","doi":"10.1109/ATS.1993.398824","DOIUrl":null,"url":null,"abstract":"Signature compression is widely used to reduce the volume of information generated by testing. Localization of the faulty component in the system under test, starting from the signature analysis, may be a complex problem related to identification of the erroneous bits in the sequence being compressed and to the error model of the system. A first technique for low-multiplicity errors is based on error effects' superposition. A novel general solution is derived for any-multiplicity errors from the analytical description of signature compression.<<ETX>>","PeriodicalId":228291,"journal":{"name":"Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)","volume":"97 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Error localization in test outputs: A generalized analysis of signature compression\",\"authors\":\"S. Demidenko, V. Piuri, A. Ivaniukovich\",\"doi\":\"10.1109/ATS.1993.398824\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Signature compression is widely used to reduce the volume of information generated by testing. Localization of the faulty component in the system under test, starting from the signature analysis, may be a complex problem related to identification of the erroneous bits in the sequence being compressed and to the error model of the system. A first technique for low-multiplicity errors is based on error effects' superposition. A novel general solution is derived for any-multiplicity errors from the analytical description of signature compression.<<ETX>>\",\"PeriodicalId\":228291,\"journal\":{\"name\":\"Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)\",\"volume\":\"97 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-11-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1993.398824\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1993.398824","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Error localization in test outputs: A generalized analysis of signature compression
Signature compression is widely used to reduce the volume of information generated by testing. Localization of the faulty component in the system under test, starting from the signature analysis, may be a complex problem related to identification of the erroneous bits in the sequence being compressed and to the error model of the system. A first technique for low-multiplicity errors is based on error effects' superposition. A novel general solution is derived for any-multiplicity errors from the analytical description of signature compression.<>
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
