测量GRIN光学元件毛坯折射率分布的新方法

L. Gerasimova
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引用次数: 0

摘要

光学材料折射率分布的表征是GRIN光学元件玻璃毛坯制作中的一个重要问题。大多数现有的表征方法都有不同的缺点。例如,所有的偏束测量方法都依赖于距离测量的精度,而距离测量总是受到沿样品扫描的激光束半径的限制。由于分辨率的限制,基于马赫-曾德尔干涉仪的干涉方法只能用于折射率梯度较小的光学材料。它们的缺点是对振动和温度变化的敏感性降低了测量的准确性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
New method for measuring the distribution of refractive index in blanks for GRIN optical elements
Characterization of refractive index distribution in optical materials is an important problem in the fabrication of glass blanks for GRIN optical elements. Most of the existing methods for such characterization have different disadvantages. For example, all methods of deviated beam depend on the accuracy of the distance measurements which are always limited by the radius of the laser beam scanning along the sample. Interference methods based on using a Mach-Zehnder interferometer can be used only for optical materials with small gradients of refractive index because of resolution limitations. Their disadvantage is also sensitivity to vibrations and temperature variations decreasing the accuracy of measurements.
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