Modeling and analysis of failure mechanism dependence based on Petri net

Reliability analysis based on failure mechanism takes advantage of unnecessary requirement for the field data, compared with the traditional method based on probability statistics. Current reliability analysis for systems based on failure dependence mainly focus their views on either failure level or failure process level, but barely from the aspect of failure mechanism. Our previous work used Mechanism Failure Tree (MFT) to show the correlation of failure mechanisms directly, but it is unavailable to express the dynamic flow of failure states. This paper proposed a modeling method of dependence of failure mechanism based on Petri net for electronic systems. Compared with MFT, the dynamic characteristics of failure mechanisms can be indicated effectively. In this paper, the models based on Petri net of four basic dependence of failure mechanisms which is utilized to generate the Petri net model of dependence of failure mechanism for a practical system have been given. And a case of a simple electronic system has been studied in the final part in order to illuminate the process of modeling.