{"title":"使用禁忌搜索的双分区电路","authors":"S. Lodha, D. Bhatia","doi":"10.1109/ASIC.1998.722909","DOIUrl":null,"url":null,"abstract":"VLSI circuit partitioning is an extensively studied problem. Various iterative improvement based heuristics have been, proposed for obtaining reasonably good solutions. In this paper we explore the applicability of TABU search for partitioning of electrical circuits. We briefly describe the TABU search and its application to circuit or graph partitioning. We have generated experimental results on a variety of standard benchmark circuits. Our results match in quality, and at times improve, the tightest known results in the partitioning literature. We have shown extensive comparison with at least six very well known methods for circuit partitioning.","PeriodicalId":104431,"journal":{"name":"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Bipartitioning circuits using TABU search\",\"authors\":\"S. Lodha, D. Bhatia\",\"doi\":\"10.1109/ASIC.1998.722909\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"VLSI circuit partitioning is an extensively studied problem. Various iterative improvement based heuristics have been, proposed for obtaining reasonably good solutions. In this paper we explore the applicability of TABU search for partitioning of electrical circuits. We briefly describe the TABU search and its application to circuit or graph partitioning. We have generated experimental results on a variety of standard benchmark circuits. Our results match in quality, and at times improve, the tightest known results in the partitioning literature. We have shown extensive comparison with at least six very well known methods for circuit partitioning.\",\"PeriodicalId\":104431,\"journal\":{\"name\":\"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)\",\"volume\":\"50 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-09-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASIC.1998.722909\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1998.722909","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
VLSI circuit partitioning is an extensively studied problem. Various iterative improvement based heuristics have been, proposed for obtaining reasonably good solutions. In this paper we explore the applicability of TABU search for partitioning of electrical circuits. We briefly describe the TABU search and its application to circuit or graph partitioning. We have generated experimental results on a variety of standard benchmark circuits. Our results match in quality, and at times improve, the tightest known results in the partitioning literature. We have shown extensive comparison with at least six very well known methods for circuit partitioning.