{"title":"太阳能电池的结建模—","authors":"F. Lindholm, A. Neugroschel, C. Sah","doi":"10.1109/IEDM.1976.188985","DOIUrl":null,"url":null,"abstract":"This paper describes methods that enable us to experimentally determine the recombination lifetimes in the emitter and base of a p-n-junction solar cell and the energy-gap shrinkage in the emitter for the first time. The methods integrate experiment with theory such that the quantitative analysis of the measurements is rigorously based on the underlying device physics.","PeriodicalId":106190,"journal":{"name":"1976 International Electron Devices Meeting","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Junction modeling for solar cells—Theory and experiment\",\"authors\":\"F. Lindholm, A. Neugroschel, C. Sah\",\"doi\":\"10.1109/IEDM.1976.188985\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes methods that enable us to experimentally determine the recombination lifetimes in the emitter and base of a p-n-junction solar cell and the energy-gap shrinkage in the emitter for the first time. The methods integrate experiment with theory such that the quantitative analysis of the measurements is rigorously based on the underlying device physics.\",\"PeriodicalId\":106190,\"journal\":{\"name\":\"1976 International Electron Devices Meeting\",\"volume\":\"76 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1976 International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1976.188985\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1976 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1976.188985","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Junction modeling for solar cells—Theory and experiment
This paper describes methods that enable us to experimentally determine the recombination lifetimes in the emitter and base of a p-n-junction solar cell and the energy-gap shrinkage in the emitter for the first time. The methods integrate experiment with theory such that the quantitative analysis of the measurements is rigorously based on the underlying device physics.
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