用绝缘体上硅技术制造的微环谐振器阵列的缺陷模式

2008 5th IEEE International Conference on Group IV Photonics Pub Date : 2008-10-07 DOI:10.1109/GROUP4.2008.4638173

L. Tobing, P. Dumon, R. Baets, M. Chin

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引用次数: 1

摘要

我们通过实验证明了用绝缘体上硅技术制造的相互耦合微环谐振器阵列存在缺陷模式。在不同的缺陷长度下，类供体模式和类受体模式的运动都得到了证明，并与早期的理论预测很好地吻合。

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Defect modes in microring resonator arrays fabricated in silicon-on-insulator technology

We show experimentally the existence of defect modes in mutually coupled microring resonator array fabricated in silicon-on-insulator technology. The movements of donor-like and acceptor-like modes are demonstrated for various defect lengths and in a good agreement with earlier theoretical prediction.

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2008 5th IEEE International Conference on Group IV Photonics

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