高能加速器辐射环境电子系统的鉴定

S. Uznanski, R. G. Alía, M. Brugger, C. Cangialosi, S. Danzeca, B. Todd
{"title":"高能加速器辐射环境电子系统的鉴定","authors":"S. Uznanski, R. G. Alía, M. Brugger, C. Cangialosi, S. Danzeca, B. Todd","doi":"10.23919/MIXDES.2018.8436726","DOIUrl":null,"url":null,"abstract":"Unlike a typical Radiation Hardness Assurance (RHA) methodology, this work presents a system level radiation qualification of a complex electronic system prior to component radiation characterization tests. Such a top-down approach reduces the beam time needed for qualification of components by carefully analyzing failure modes observed on the system level and performing only a subset of component tests for identified cases. This avoids system overdesign, reduces the testing workload and cost by accepting a certain residual failure rate.","PeriodicalId":349007,"journal":{"name":"2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Qualification of Electronic Systems for Radiation Environments of High Energy Accelerator\",\"authors\":\"S. Uznanski, R. G. Alía, M. Brugger, C. Cangialosi, S. Danzeca, B. Todd\",\"doi\":\"10.23919/MIXDES.2018.8436726\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Unlike a typical Radiation Hardness Assurance (RHA) methodology, this work presents a system level radiation qualification of a complex electronic system prior to component radiation characterization tests. Such a top-down approach reduces the beam time needed for qualification of components by carefully analyzing failure modes observed on the system level and performing only a subset of component tests for identified cases. This avoids system overdesign, reduces the testing workload and cost by accepting a certain residual failure rate.\",\"PeriodicalId\":349007,\"journal\":{\"name\":\"2018 25th International Conference \\\"Mixed Design of Integrated Circuits and System\\\" (MIXDES)\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 25th International Conference \\\"Mixed Design of Integrated Circuits and System\\\" (MIXDES)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/MIXDES.2018.8436726\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/MIXDES.2018.8436726","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

与典型的辐射硬度保证(RHA)方法不同,这项工作在组件辐射特性测试之前提出了复杂电子系统的系统级辐射鉴定。这种自顶向下的方法通过仔细分析在系统级别观察到的故障模式,并仅对已确定的情况执行组件测试的子集,减少了组件鉴定所需的光束时间。这避免了系统的过度设计,通过接受一定的剩余故障率减少了测试工作量和成本。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Qualification of Electronic Systems for Radiation Environments of High Energy Accelerator
Unlike a typical Radiation Hardness Assurance (RHA) methodology, this work presents a system level radiation qualification of a complex electronic system prior to component radiation characterization tests. Such a top-down approach reduces the beam time needed for qualification of components by carefully analyzing failure modes observed on the system level and performing only a subset of component tests for identified cases. This avoids system overdesign, reduces the testing workload and cost by accepting a certain residual failure rate.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信