{"title":"电磁仿真测试板支持系统的封装测试","authors":"G. Surbeck, C. Jackson","doi":"10.1109/IMOC.2003.1244909","DOIUrl":null,"url":null,"abstract":"A model of a printed circuit board used to test an RF receiver system in package (SiP) is presented. A single 3D EM model can be created for the SMA, printed circuit test board, and package socket mount. The model gives a superior match to measured data compared to a lumped element equivalent circuit. The model provides a full two-port network where a direct measurement cannot be made.","PeriodicalId":156662,"journal":{"name":"Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003. (Cat. No.03TH8678)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electromagnetic simulation of a test board to support system in package testing\",\"authors\":\"G. Surbeck, C. Jackson\",\"doi\":\"10.1109/IMOC.2003.1244909\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A model of a printed circuit board used to test an RF receiver system in package (SiP) is presented. A single 3D EM model can be created for the SMA, printed circuit test board, and package socket mount. The model gives a superior match to measured data compared to a lumped element equivalent circuit. The model provides a full two-port network where a direct measurement cannot be made.\",\"PeriodicalId\":156662,\"journal\":{\"name\":\"Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003. (Cat. No.03TH8678)\",\"volume\":\"61 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-11-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003. (Cat. No.03TH8678)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMOC.2003.1244909\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003. (Cat. No.03TH8678)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMOC.2003.1244909","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electromagnetic simulation of a test board to support system in package testing
A model of a printed circuit board used to test an RF receiver system in package (SiP) is presented. A single 3D EM model can be created for the SMA, printed circuit test board, and package socket mount. The model gives a superior match to measured data compared to a lumped element equivalent circuit. The model provides a full two-port network where a direct measurement cannot be made.