电磁仿真测试板支持系统的封装测试

G. Surbeck, C. Jackson
{"title":"电磁仿真测试板支持系统的封装测试","authors":"G. Surbeck, C. Jackson","doi":"10.1109/IMOC.2003.1244909","DOIUrl":null,"url":null,"abstract":"A model of a printed circuit board used to test an RF receiver system in package (SiP) is presented. A single 3D EM model can be created for the SMA, printed circuit test board, and package socket mount. The model gives a superior match to measured data compared to a lumped element equivalent circuit. The model provides a full two-port network where a direct measurement cannot be made.","PeriodicalId":156662,"journal":{"name":"Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003. (Cat. No.03TH8678)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electromagnetic simulation of a test board to support system in package testing\",\"authors\":\"G. Surbeck, C. Jackson\",\"doi\":\"10.1109/IMOC.2003.1244909\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A model of a printed circuit board used to test an RF receiver system in package (SiP) is presented. A single 3D EM model can be created for the SMA, printed circuit test board, and package socket mount. The model gives a superior match to measured data compared to a lumped element equivalent circuit. The model provides a full two-port network where a direct measurement cannot be made.\",\"PeriodicalId\":156662,\"journal\":{\"name\":\"Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003. (Cat. No.03TH8678)\",\"volume\":\"61 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-11-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003. (Cat. No.03TH8678)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMOC.2003.1244909\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003. (Cat. No.03TH8678)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMOC.2003.1244909","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

介绍了一种用于封装射频接收系统(SiP)测试的印刷电路板模型。可以为SMA、印刷电路测试板和封装插座安装创建单个3D EM模型。与集总元件等效电路相比,该模型对实测数据的匹配性更好。该模型提供了一个完整的双端口网络,无法进行直接测量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electromagnetic simulation of a test board to support system in package testing
A model of a printed circuit board used to test an RF receiver system in package (SiP) is presented. A single 3D EM model can be created for the SMA, printed circuit test board, and package socket mount. The model gives a superior match to measured data compared to a lumped element equivalent circuit. The model provides a full two-port network where a direct measurement cannot be made.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信