利用分子模型进行柔性电子器件界面比较

N. Iwamoto, Carol Putman, Gregory Vernon, Rachel Cramm Horn, A. Bernreuther
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引用次数: 0

摘要

虽然柔性电路领域并不新鲜,但当前的显示和便携式电子消费市场正在推动设备和封装设计,这些设计将要求越来越高的稳健性,特别是随着越来越多的设备被推向轻量级,可穿戴设计,以增强个人IOT(物联网)关联。对于柔性电子产品的开发人员来说,充分了解关键接口的弱点将是一个优势,从而有助于推动新材料的开发。为了了解这些界面的相对弱点,应用分子模型研究界面失效已应用于挠性电路粘合剂-金属界面。特别是铜/粘合剂和铬/粘合剂的界面已经使用粘合剂的主要聚合物成分和金属氧化物进行了建模。本文将讨论这些模型的结果,以及聚合物成分如何导致特定的界面失效,以及与观察到的失效的一致性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Interface comparison involved in flexible electronics using molecular modeling
Although the area of flexible circuits is not new, current display and portable electronics consumer markets are driving device and packaging designs that will require increasingly higher robustness, especially as more devices are driven toward lightweight, wearable designs that enhance the personal IOT (Internet of Things) association. There will be an advantage for developers in flexible electronics to fully understand critical interface weaknesses that can in-turn help to push new material development. The use of molecular modeling to study interfacial failure has been applied to the flex circuit adhesive-to-metal interfaces in order to understand the relative weaknesses at these interfaces. Specifically copper/adhesive and chromium/adhesive interfaces have been modeled using the major polymer components of the adhesive and the metal oxides. This paper will discuss the results of these models and how polymer composition may be contributing to specific interface failure, and consistencies with observed failure.
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