{"title":"用增强电路检测可逆电路中的卡滞和桥接故障","authors":"Mousum Handique, J. K. Deka, S. Biswas","doi":"10.1109/ATS52891.2021.00022","DOIUrl":null,"url":null,"abstract":"Low-power design is a major concern in the circuit design domain. The reversible circuit is an alternative for moving beyond the conventional ways of computing. For performing the high reliability and the correctness of the circuit, testing is necessary for evaluating the faults. This paper presents the fault detection method for classical fault models like stuck-at faults and bridging faults in reversible circuits using the negative-controlled augmented k-CNOT based circuit. We initially construct the n number of test vectors with n input lines for a given circuit. The constructed test vector sequences successfully attempt as the complete test set on the testable design augmented k-CNOT circuit for detecting faults. The proposed method applies to several benchmark circuits for detecting the stuck-at and bridging faults and also comparative analysis is prepared with some existing works.","PeriodicalId":432330,"journal":{"name":"2021 IEEE 30th Asian Test Symposium (ATS)","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Detection of Stuck-at and Bridging Fault in Reversible Circuits using an Augmented Circuit\",\"authors\":\"Mousum Handique, J. K. Deka, S. Biswas\",\"doi\":\"10.1109/ATS52891.2021.00022\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Low-power design is a major concern in the circuit design domain. The reversible circuit is an alternative for moving beyond the conventional ways of computing. For performing the high reliability and the correctness of the circuit, testing is necessary for evaluating the faults. This paper presents the fault detection method for classical fault models like stuck-at faults and bridging faults in reversible circuits using the negative-controlled augmented k-CNOT based circuit. We initially construct the n number of test vectors with n input lines for a given circuit. The constructed test vector sequences successfully attempt as the complete test set on the testable design augmented k-CNOT circuit for detecting faults. The proposed method applies to several benchmark circuits for detecting the stuck-at and bridging faults and also comparative analysis is prepared with some existing works.\",\"PeriodicalId\":432330,\"journal\":{\"name\":\"2021 IEEE 30th Asian Test Symposium (ATS)\",\"volume\":\"121 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 30th Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS52891.2021.00022\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 30th Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS52891.2021.00022","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Detection of Stuck-at and Bridging Fault in Reversible Circuits using an Augmented Circuit
Low-power design is a major concern in the circuit design domain. The reversible circuit is an alternative for moving beyond the conventional ways of computing. For performing the high reliability and the correctness of the circuit, testing is necessary for evaluating the faults. This paper presents the fault detection method for classical fault models like stuck-at faults and bridging faults in reversible circuits using the negative-controlled augmented k-CNOT based circuit. We initially construct the n number of test vectors with n input lines for a given circuit. The constructed test vector sequences successfully attempt as the complete test set on the testable design augmented k-CNOT circuit for detecting faults. The proposed method applies to several benchmark circuits for detecting the stuck-at and bridging faults and also comparative analysis is prepared with some existing works.