嵌入式SRAM的最坏情况设计和余量

2007 Design, Automation & Test in Europe Conference & Exhibition Pub Date : 2007-04-16 DOI:10.1145/1266366.1266648

R. Aitken, Sachin Idgunji

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引用次数: 25

摘要

嵌入式SRAM成品率设计的一个重要方面是确定预期的最坏情况，以保证有足够的设计余量。此前，这涉及多个模拟弯道和极端测试条件。这表明，统计问题和设备可变性现在需要一种不同的方法，基于极值理论的工作。该方法用于开发存储器中与变异性相关的产量的下界

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Worst-Case Design and Margin for Embedded SRAM

An important aspect of design for yield for embedded SRAM is identifying the expected worst case behavior in order to guarantee that sufficient design margin is present. Previously, this has involved multiple simulation corners and extreme test conditions. It is shown that statistical concerns and device variability now require a different approach, based on work in extreme value theory. This method is used to develop a lower-bound for variability-related yield in memories

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2007 Design, Automation & Test in Europe Conference & Exhibition

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