{"title":"对模拟和混合信号电路的不同动态测试技术进行测试权衡","authors":"N. Nagi, J. Abraham","doi":"10.1109/ICEDTM.1994.496102","DOIUrl":null,"url":null,"abstract":"Several methods for testing the dynamic characteristics and the frequency response of analeg and mixedsignal circuits include input excitations consisting of single or multiple sine waves, pulses, pseudo/white noise or normal operating signals. These techniques differ widely in the test measurement time and the data processing time required for the frequency response characterization, as well as in their effectiveness for detecting errors. This paper will provide a comparative study of the different dynamic testing techniques in terms of the measurement and analysis times as well as test effectiveness.","PeriodicalId":319739,"journal":{"name":"Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Test trade-offs for different dynamic testing techniques for analog and mixed-signal circuits\",\"authors\":\"N. Nagi, J. Abraham\",\"doi\":\"10.1109/ICEDTM.1994.496102\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Several methods for testing the dynamic characteristics and the frequency response of analeg and mixedsignal circuits include input excitations consisting of single or multiple sine waves, pulses, pseudo/white noise or normal operating signals. These techniques differ widely in the test measurement time and the data processing time required for the frequency response characterization, as well as in their effectiveness for detecting errors. This paper will provide a comparative study of the different dynamic testing techniques in terms of the measurement and analysis times as well as test effectiveness.\",\"PeriodicalId\":319739,\"journal\":{\"name\":\"Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-05-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEDTM.1994.496102\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEDTM.1994.496102","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Test trade-offs for different dynamic testing techniques for analog and mixed-signal circuits
Several methods for testing the dynamic characteristics and the frequency response of analeg and mixedsignal circuits include input excitations consisting of single or multiple sine waves, pulses, pseudo/white noise or normal operating signals. These techniques differ widely in the test measurement time and the data processing time required for the frequency response characterization, as well as in their effectiveness for detecting errors. This paper will provide a comparative study of the different dynamic testing techniques in terms of the measurement and analysis times as well as test effectiveness.