{"title":"用于CMOS电路的电流估计器","authors":"F. Najm, R. Burch, Ping Yang, I. Hajj","doi":"10.1109/ICCAD.1988.122494","DOIUrl":null,"url":null,"abstract":"CREST is a pattern-independent current estimation approach developed to support electromigration analysis tools. It uses the powerful, original concept of probabilistic simulation to generate accurate estimates of the expected current waveforms efficiently. The original implementation of CREST is extended to circuits containing pass transistors, reconvergent fanout, and feedback, and heuristics to simulate circuits with large reconvergent fanout or feedback blocks efficiently are provided. The results of using CREST on several real circuits are presented.<<ETX>>","PeriodicalId":285078,"journal":{"name":"[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"46","resultStr":"{\"title\":\"CREST-a current estimator for CMOS circuits\",\"authors\":\"F. Najm, R. Burch, Ping Yang, I. Hajj\",\"doi\":\"10.1109/ICCAD.1988.122494\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"CREST is a pattern-independent current estimation approach developed to support electromigration analysis tools. It uses the powerful, original concept of probabilistic simulation to generate accurate estimates of the expected current waveforms efficiently. The original implementation of CREST is extended to circuits containing pass transistors, reconvergent fanout, and feedback, and heuristics to simulate circuits with large reconvergent fanout or feedback blocks efficiently are provided. The results of using CREST on several real circuits are presented.<<ETX>>\",\"PeriodicalId\":285078,\"journal\":{\"name\":\"[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-11-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"46\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCAD.1988.122494\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.1988.122494","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
CREST is a pattern-independent current estimation approach developed to support electromigration analysis tools. It uses the powerful, original concept of probabilistic simulation to generate accurate estimates of the expected current waveforms efficiently. The original implementation of CREST is extended to circuits containing pass transistors, reconvergent fanout, and feedback, and heuristics to simulate circuits with large reconvergent fanout or feedback blocks efficiently are provided. The results of using CREST on several real circuits are presented.<>