时钟存储元件对过程变化的鲁棒性

2009 IEEE 8th International Conference on ASIC Pub Date : 2009-12-11 DOI:10.1109/ASICON.2009.5351566

Joosik Moon, M. Aktan, V. Oklobdzija

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引用次数: 6

摘要

在这项工作中，不同类型的时钟存储元件在工艺变化对其性能的影响方面进行了比较。晶体管的尺寸由节能特性得到，并在仿真中用于测量由工艺变化引起的延迟变化。时钟存储元件的结构影响其对过程变化的鲁棒性。

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Clocked storage elements robust to process variations

In this work, different types of clocked storage elements are compared in terms of the impact of process variations on their performances. Transistor sizes are obtained from energy-efficient characteristics and used in the simulation to measure the delay variations caused by process variations. The structure of a clocked storage element affects its robustness to process variations.

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来源期刊

2009 IEEE 8th International Conference on ASIC

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