E. Baier, R. Clemen, W. Haug, W. Fischer, R. Mueller, W. Loehlein, H. Barsuhn
{"title":"256k nmos DRAM","authors":"E. Baier, R. Clemen, W. Haug, W. Fischer, R. Mueller, W. Loehlein, H. Barsuhn","doi":"10.1109/ISSCC.1984.1156712","DOIUrl":null,"url":null,"abstract":"A 80ns 256K n-channel metal-gate DRAM with tour selectable data I/O buffers which permit the chip to be used as 64K×4, 128 × 2, or 256 × 1, with either parallel or serial data transfer at 20ns data rate, will be discussed.","PeriodicalId":260117,"journal":{"name":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A 256K NMOS DRAM\",\"authors\":\"E. Baier, R. Clemen, W. Haug, W. Fischer, R. Mueller, W. Loehlein, H. Barsuhn\",\"doi\":\"10.1109/ISSCC.1984.1156712\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 80ns 256K n-channel metal-gate DRAM with tour selectable data I/O buffers which permit the chip to be used as 64K×4, 128 × 2, or 256 × 1, with either parallel or serial data transfer at 20ns data rate, will be discussed.\",\"PeriodicalId\":260117,\"journal\":{\"name\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1984.1156712\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1984.1156712","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 80ns 256K n-channel metal-gate DRAM with tour selectable data I/O buffers which permit the chip to be used as 64K×4, 128 × 2, or 256 × 1, with either parallel or serial data transfer at 20ns data rate, will be discussed.