时效对Sn-9Zn-xCr钎料与Cu衬底界面反应的影响

Xi Chen, A. Hu, Ming Li, D. Mao
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引用次数: 4

摘要

在85℃、20% ~ 85%的相对湿度下时效100、200、350、500 h,研究了添加0.05、0.1、0.3、0.5 wt.% Cr对Sn-9Zn- xcr /Cu界面金属间化合物层(IMCs)生长的影响。结果表明:时效后Sn-9Zn-Cr合金的IMCs厚度比Sn-9Zn合金薄很多,但IMCs厚度差异不大;值得注意的是,Sn-9Zn- cr合金的IMCs生长速度约为Sn-9Zn合金的1/4倍。我们推测其原因是Cr可以减缓Zn在焊料中的扩散速度。认为Sn-9Zn- cr焊点由于金属间化合物层较薄,可靠性优于Sn-9Zn焊点是完全合理的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of Aging on the Interfacial Reaction between Sn-9Zn-xCr Solder and Cu Substrate
Lhe influences of adding 0.05, 0.1, 0.3, 0.5 wt.% Cr to Sn-9Zn alloy on growth of intermetallic compound layer (IMCs) at the interface of Sn-9Zn-xCr/Cu was investigated during aging treatment at 85degC and relative humidity from 20% to 85% for 100 h, 200 h, 350 h, 500 h. Lhe results show that IMCs thickness of Sn-9Zn-Cr alloys is much thinner than that of Sn-9Zn alloy after aging, but there is little difference on IMCs thicknesses among Sn-9Zn-Cr alloys. It is of interest to note that IMCs growth rate of Sn-9Zn-Cr is about 1/4 times of that of Sn-9Zn alloy. We supposed the reason is that Cr can slow down diffusion rate of Zn in solder. It is quite reasonable to consider that reliability of Sn-9Zn-Cr solder joints is better than that of Sn-9Zn solder joints because of thinner intermetallic compound layer.
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