{"title":"基于SRAM的fpga互连单故障诊断","authors":"Yinlei Yu, Jian Xu, Wei-Kang Huang, F. Lombardi","doi":"10.1109/ASPDAC.1999.760014","DOIUrl":null,"url":null,"abstract":"This paper presents a method to diagnose faults in FPGA interconnection resources. A single fault model is given. Under the given model, a diagnosing method is proposed. At most five programming steps in the proposed method is required if adaptive testing scheme is used. For non-adaptive test, eight programming steps is required to diagnose all the possible faults under the given single fault model. The accuracy of the fault diagnosing is one segment for a segment stuck-at or stuck-open fault, a segment pair for a bridge fault, a switch for switch stuck-on or stuck-off fault.","PeriodicalId":201352,"journal":{"name":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","volume":"140 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Diagnosing single faults for interconnects in SRAM based FPGAs\",\"authors\":\"Yinlei Yu, Jian Xu, Wei-Kang Huang, F. Lombardi\",\"doi\":\"10.1109/ASPDAC.1999.760014\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a method to diagnose faults in FPGA interconnection resources. A single fault model is given. Under the given model, a diagnosing method is proposed. At most five programming steps in the proposed method is required if adaptive testing scheme is used. For non-adaptive test, eight programming steps is required to diagnose all the possible faults under the given single fault model. The accuracy of the fault diagnosing is one segment for a segment stuck-at or stuck-open fault, a segment pair for a bridge fault, a switch for switch stuck-on or stuck-off fault.\",\"PeriodicalId\":201352,\"journal\":{\"name\":\"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)\",\"volume\":\"140 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-01-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASPDAC.1999.760014\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.1999.760014","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Diagnosing single faults for interconnects in SRAM based FPGAs
This paper presents a method to diagnose faults in FPGA interconnection resources. A single fault model is given. Under the given model, a diagnosing method is proposed. At most five programming steps in the proposed method is required if adaptive testing scheme is used. For non-adaptive test, eight programming steps is required to diagnose all the possible faults under the given single fault model. The accuracy of the fault diagnosing is one segment for a segment stuck-at or stuck-open fault, a segment pair for a bridge fault, a switch for switch stuck-on or stuck-off fault.