X-Gen:系统和soc的随机测试用例生成器

Roy Emek, Itai Jaeger, Y. Naveh, Gadi Bergman, Guy Aloni, Yoav Katz, Monica Farkash, Igor Dozoretz, Alex Goldin
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引用次数: 63

摘要

我们介绍了X-Gen,一个基于模型的测试用例生成器,专为系统和片上系统(SoC)设计。X-Gen为生成系统级测试用例提供了一个框架和一组构建块。这个框架的核心是一个系统模型,它由组件类型、它们的配置以及它们之间的交互组成。构建块包括常用的概念,如存储器、寄存器和地址转换机制。一旦系统被建模,X-Gen就会提供一种丰富的语言来描述测试用例。通过这种语言,用户可以指定涵盖从高度定向测试到完全随机测试的全部范围的请求。X-Gen目前在IBM初步用于验证两种不同的设计——高端多处理器服务器和最先进的SoC。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
X-Gen: a random test-case generator for systems and SoCs
We present X-Gen, a model-based test-case generator designed for systems and systems on a chip (SoC). X-Gen provides a framework and a set of building blocks for system-level test-case generation. At the core of this framework lies a system model, which consists of component types, their configuration, and the interactions between them. Building blocks include commonly used concepts such as memories, registers, and address translation mechanisms. Once a system is modeled, X-Gen provides a rich language for describing test cases. Through this language, users can specify requests that cover the full spectrum between highly directed tests to completely random ones. X-Gen is currently in preliminary use at IBM for the verification of two different designs - a high-end multi-processor server and a state-of-the-art SoC.
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