M. Margala, S. Dragic, Ahmed El-Abasiry, S. Ekpe, V. Stopjaková
{"title":"用于在线混合信号/模拟测试的1-V快速I/sub DDQ/电流传感器","authors":"M. Margala, S. Dragic, Ahmed El-Abasiry, S. Ekpe, V. Stopjaková","doi":"10.1109/OLT.2000.856618","DOIUrl":null,"url":null,"abstract":"This paper proposes a novel, ultra low-voltage design of a built-in current sensor for testing mixed-signal circuits. Designed in 0.18 /spl mu/ CMOS technology, the monitor is based on the principle of a current mirror that is supported by the converting and output stages. The design is easily applicable in testing mixed-signal circuits. The sensor is designed for the power supply of 1.0 V that offers acceptance in low-voltage test applications. Presented results demonstrate excellent performances of the on-chip monitor.","PeriodicalId":334770,"journal":{"name":"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"1-V fast I/sub DDQ/ current sensor for on-line mixed-signal/analog test\",\"authors\":\"M. Margala, S. Dragic, Ahmed El-Abasiry, S. Ekpe, V. Stopjaková\",\"doi\":\"10.1109/OLT.2000.856618\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a novel, ultra low-voltage design of a built-in current sensor for testing mixed-signal circuits. Designed in 0.18 /spl mu/ CMOS technology, the monitor is based on the principle of a current mirror that is supported by the converting and output stages. The design is easily applicable in testing mixed-signal circuits. The sensor is designed for the power supply of 1.0 V that offers acceptance in low-voltage test applications. Presented results demonstrate excellent performances of the on-chip monitor.\",\"PeriodicalId\":334770,\"journal\":{\"name\":\"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)\",\"volume\":\"37 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/OLT.2000.856618\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OLT.2000.856618","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
1-V fast I/sub DDQ/ current sensor for on-line mixed-signal/analog test
This paper proposes a novel, ultra low-voltage design of a built-in current sensor for testing mixed-signal circuits. Designed in 0.18 /spl mu/ CMOS technology, the monitor is based on the principle of a current mirror that is supported by the converting and output stages. The design is easily applicable in testing mixed-signal circuits. The sensor is designed for the power supply of 1.0 V that offers acceptance in low-voltage test applications. Presented results demonstrate excellent performances of the on-chip monitor.