{"title":"TATOO:一个工业时序分析仪与假路径消除和测试模式生成","authors":"J. Benkoski, Ronald B. Stewart","doi":"10.1109/EDAC.1991.206403","DOIUrl":null,"url":null,"abstract":"TATOO is an industrial interactive timing analysis system evolved from recently developed false path elimination algorithms. These have been extended to perform more complex searches that facilitate the rapid survey of a network. An automatic test pattern generation mechanism which exercises the statically sensitizable paths has been developed. This forms a direct link to an electrical simulator. The critical path through a network of hundreds of gates is found, the test pattern generated, the critical path simulated, and the resulting waveforms displayed in less than two minutes.<<ETX>>","PeriodicalId":425087,"journal":{"name":"Proceedings of the European Conference on Design Automation.","volume":"144 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-02-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"TATOO: an industrial timing analyzer with false path elimination and test pattern generation\",\"authors\":\"J. Benkoski, Ronald B. Stewart\",\"doi\":\"10.1109/EDAC.1991.206403\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"TATOO is an industrial interactive timing analysis system evolved from recently developed false path elimination algorithms. These have been extended to perform more complex searches that facilitate the rapid survey of a network. An automatic test pattern generation mechanism which exercises the statically sensitizable paths has been developed. This forms a direct link to an electrical simulator. The critical path through a network of hundreds of gates is found, the test pattern generated, the critical path simulated, and the resulting waveforms displayed in less than two minutes.<<ETX>>\",\"PeriodicalId\":425087,\"journal\":{\"name\":\"Proceedings of the European Conference on Design Automation.\",\"volume\":\"144 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-02-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the European Conference on Design Automation.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDAC.1991.206403\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the European Conference on Design Automation.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDAC.1991.206403","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
TATOO: an industrial timing analyzer with false path elimination and test pattern generation
TATOO is an industrial interactive timing analysis system evolved from recently developed false path elimination algorithms. These have been extended to perform more complex searches that facilitate the rapid survey of a network. An automatic test pattern generation mechanism which exercises the statically sensitizable paths has been developed. This forms a direct link to an electrical simulator. The critical path through a network of hundreds of gates is found, the test pattern generated, the critical path simulated, and the resulting waveforms displayed in less than two minutes.<>