冲击和振动过载情况下MEMS器件的可靠性

SPIE MOEMS-MEMS Pub Date : 2008-02-07 DOI:10.1117/12.763617
S. Kurth, A. Shaporin, K. Hiller, C. Kaufmann, T. Gessner
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引用次数: 5

摘要

这篇贡献描述了基于线性振动理论,通过将复合反应分解为共振模式反应和观察反应,对过载失效和过载反应原因的研究。脉冲比峰值偏转(ISPD)是某一冲击的一般特性。它适用于预测任意谐振频率的某一谐振模式在冲击作用下的机械挠度。通过扫描激光多普勒干涉仪(SLDI)测量法布里珀罗干涉仪可调谐红外滤光片的实例,进一步分析和验证了这一点。将ISPD预测结果与SLDI测量结果和有限元分析结果进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reliability of MEMS devices in shock and vibration overload situations
This contribution describes the investigation of the reasons for overload failure and overload reaction based on linear vibration theory by decomposition of the complex reaction into resonant mode reactions and on observation of the reaction. An impulse specific peak deflection (ISPD) is derived as a general characteristic property of a certain shock. It is applicable to predict the mechanical deflection of a certain resonant mode of an arbitrary resonant frequency due to a shock. This is further analyzed and proofed by scanning Laser Doppler interferometer (SLDI) measurement on the example of a Fabry Perot interferometer based tunable infrared filter. The results from ISPD prediction are compared to SLDI measurements and to finite element analysis results.
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