使用高衬底电阻的ka波段低损耗和高隔离0.13 /spl μ m CMOS SPST/SPDT开关

Byung-Wook Min, Gabriel M. Rebeiz
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引用次数: 24

摘要

本文介绍了35 GHz单极单掷(SPST)和单极双掷(SPDT) CMOS开关,采用0.13 mum BiCMOS工艺(IBM 8 HP)。CMOS晶体管被设计成具有高衬底电阻,以最小化插入损耗并提高功率处理能力。SPST/SPDT开关的插入损耗分别为1.8 dB/2.2 dB,输入1-dB压缩点(P1 dB)大于22 dBm。在35-40 GHz时,隔离度大于30 dB,并使用两个并联谐振网络实现。据我们所知,这是在ka波段频率下首次演示低损耗,高隔离的CMOS开关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Ka-Band Low-Loss and High-Isolation 0.13 /spl mu/m CMOS SPST/SPDT Switches Using High Substrate Resistance
This paper presents 35 GHz single-pole-single-throw (SPST) and single-pole-double-throw (SPDT) CMOS switches using a 0.13 mum BiCMOS process (IBM 8 HP). The CMOS transistors are designed to have a high substrate resistance to minimize the insertion loss and improve power handling capability. The SPST/SPDT switches have a insertion loss of 1.8 dB/2.2 dB, respectively, and an input 1-dB compression point (P1 dB) greater than 22 dBm. The isolation is greater than 30 dB at 35-40 GHz and is achieved using two parallel resonant networks. To our knowledge, this is the first demonstration of low-loss, high-isolation CMOS switches at Ka-band frequencies.
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