有机基板结构和设计如何提高装配的稳健性

B. Y. Low, Ravishankar Freescale
{"title":"有机基板结构和设计如何提高装配的稳健性","authors":"B. Y. Low, Ravishankar Freescale","doi":"10.1109/ASQED.2009.5206269","DOIUrl":null,"url":null,"abstract":"This paper focuses on how the PBGA (plastic ball grid array) organic substrate structure and traces design improve the assembly packaging robustness. Via plugging process at the substrate fabrication has been studied. Comparison of substrate without via plug, laminate substrate with via plugging process increases the overall hardness of the substrate. This is due to the via plug materials use (IR6) is a harder materials than the solder resist. Another area of study is the addition of dummy traces design on the air venting area improves the solder resist evenness by elimination mold resin bleed.","PeriodicalId":437303,"journal":{"name":"2009 1st Asia Symposium on Quality Electronic Design","volume":"91 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"How organic substrate structure & design improve assembly robustness\",\"authors\":\"B. Y. Low, Ravishankar Freescale\",\"doi\":\"10.1109/ASQED.2009.5206269\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper focuses on how the PBGA (plastic ball grid array) organic substrate structure and traces design improve the assembly packaging robustness. Via plugging process at the substrate fabrication has been studied. Comparison of substrate without via plug, laminate substrate with via plugging process increases the overall hardness of the substrate. This is due to the via plug materials use (IR6) is a harder materials than the solder resist. Another area of study is the addition of dummy traces design on the air venting area improves the solder resist evenness by elimination mold resin bleed.\",\"PeriodicalId\":437303,\"journal\":{\"name\":\"2009 1st Asia Symposium on Quality Electronic Design\",\"volume\":\"91 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-07-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 1st Asia Symposium on Quality Electronic Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASQED.2009.5206269\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 1st Asia Symposium on Quality Electronic Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASQED.2009.5206269","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文重点研究PBGA(塑料球栅阵列)有机衬底结构和走线设计如何提高组装封装的稳健性。通过对衬底的插接工艺进行了研究。与不带孔塞的基材相比,带孔塞工艺的层压板基材提高了基材的整体硬度。这是由于通孔插头使用的材料(IR6)是一种比阻焊剂更硬的材料。另一个研究领域是在排气区域增加假迹设计,通过消除模具树脂溢出来提高抗焊锡均匀性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
How organic substrate structure & design improve assembly robustness
This paper focuses on how the PBGA (plastic ball grid array) organic substrate structure and traces design improve the assembly packaging robustness. Via plugging process at the substrate fabrication has been studied. Comparison of substrate without via plug, laminate substrate with via plugging process increases the overall hardness of the substrate. This is due to the via plug materials use (IR6) is a harder materials than the solder resist. Another area of study is the addition of dummy traces design on the air venting area improves the solder resist evenness by elimination mold resin bleed.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信