脉冲iv /射频b类工作的自适应二次谐波有源负载

S. Doo, P. Roblin, V. Balasubramanian, Richard Taylor, K. Dandu, G. Jessen, R. Rojas
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引用次数: 3

摘要

为了在b类工作条件下提供适当的负载阻抗终止,针对脉冲- iv偏置和脉冲-RF(脉冲- iv /RF)激励,提出了一种自适应谐波有源负载。脉冲iv /RF测量是射频器件表征和建模的首选技术,因为它保证晶体管不受低频记忆效应的影响。它也是一种有前途的技术,以协助设计高效的脉冲功率放大器用于时分多址或雷达应用。本文将用于连续波激励的多谐有源负载-拉技术推广到脉冲- iv脉冲射频激励。谐波负载由一个主动负载和一个大信号网络分析仪(LSNA)组成,在计算机控制下进行自适应调谐。该技术在GaN HEMT和工作在b类的65 nm NMOS晶体管上进行了演示,以量化与连续波操作相比,脉冲iv /脉冲rf操作中记忆效应的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Adaptive second harmonic active load for pulsed-IV/RF class-B operation
To provide a proper load impedance termination under class-B operation, for pulsed-IV biasing and pulsed-RF (pulsed-IV/RF) excitations, an adaptive harmonic active load is presented. Pulsed-IV/RF measurement is the technique of choice for characterization and modeling of RF devices as it guarantees that the transistor is not afflicted by low-frequency memory effects. It is also a promising technique to assist with the design of efficient pulsed power-amplifiers for TDMA or radar applications. In this work the multi-harmonic active load-pull technique used for CW excitations is extended to pulsed-IV pulsed RF excitations. The harmonic load was implemented with an active load and a large signal network analyzer (LSNA) both under computer control for adaptive tuning. The technique is demonstrated on both a GaN HEMT and a 65 nm NMOS transistor operating in class-B to quantify the impact of memory effects in pulsed-IV/pulsed-RF operation compared to CW operation.
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