{"title":"一种测量磁芯磁滞损耗的不同方法","authors":"B. Evstatiev, Dimcho V. Kiriakov, I. Beloev","doi":"10.1109/SIITME.2017.8259876","DOIUrl":null,"url":null,"abstract":"In the present study a novel approach for measurement of loses due to hysteresis in magnetic cores has been presented. The measurement system makes sure the measured voltages, representing the magnetic field B(t) and field intensity H(t), are in-phase in order to correctly obtain the losses. This is achieved through the use of two cascaded low-pass filters, whose cut-off frequencies are equal to the fundamental frequency. The performed experiment proved that the measured voltages are inphase and they can be used to correctly obtain the losses. The results are compared with situations where the two quantities are slightly out-of-phase, and the relative errors are evaluated.","PeriodicalId":138347,"journal":{"name":"2017 IEEE 23rd International Symposium for Design and Technology in Electronic Packaging (SIITME)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A different approach for measurement of hysteresis losses in magnetic cores\",\"authors\":\"B. Evstatiev, Dimcho V. Kiriakov, I. Beloev\",\"doi\":\"10.1109/SIITME.2017.8259876\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the present study a novel approach for measurement of loses due to hysteresis in magnetic cores has been presented. The measurement system makes sure the measured voltages, representing the magnetic field B(t) and field intensity H(t), are in-phase in order to correctly obtain the losses. This is achieved through the use of two cascaded low-pass filters, whose cut-off frequencies are equal to the fundamental frequency. The performed experiment proved that the measured voltages are inphase and they can be used to correctly obtain the losses. The results are compared with situations where the two quantities are slightly out-of-phase, and the relative errors are evaluated.\",\"PeriodicalId\":138347,\"journal\":{\"name\":\"2017 IEEE 23rd International Symposium for Design and Technology in Electronic Packaging (SIITME)\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE 23rd International Symposium for Design and Technology in Electronic Packaging (SIITME)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SIITME.2017.8259876\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 23rd International Symposium for Design and Technology in Electronic Packaging (SIITME)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIITME.2017.8259876","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A different approach for measurement of hysteresis losses in magnetic cores
In the present study a novel approach for measurement of loses due to hysteresis in magnetic cores has been presented. The measurement system makes sure the measured voltages, representing the magnetic field B(t) and field intensity H(t), are in-phase in order to correctly obtain the losses. This is achieved through the use of two cascaded low-pass filters, whose cut-off frequencies are equal to the fundamental frequency. The performed experiment proved that the measured voltages are inphase and they can be used to correctly obtain the losses. The results are compared with situations where the two quantities are slightly out-of-phase, and the relative errors are evaluated.