保护片上系统的测试基础设施

Grigor Tshagharyan, Gurgen Harutunyan, S. Shoukourian, Y. Zorian
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引用次数: 5

摘要

现代技术的快速发展及其在众多应用领域的广泛应用,给我们带来了新的挑战。多年来,安全问题已成为人们关注的主要问题之一。定期报告新的数据和系统泄露事件。为此,攻击者通常利用系统中的不同侧通道来绕过保护机制。在这方面,特别脆弱的是放置在片上系统(SoC)上的传统测试和调试基础设施,它提供了进入芯片内部结构的替代路径。本文的目的是全面概述SoC的各个安全方面,包括已知的威胁模型,攻击者分类和现有技术,并提出安全SoC测试基础设施的解决方案概念,重点是嵌入式内核测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Securing test infrastructure of system-on-chips
The rapid development in the modern technology and its widespread utilization in number of applications brings in new challenges that need to be addressed. Security is one of such challenges that has grown into a major concern over the years. Periodically new incidents of data and system breaches are reported. For this purpose, usually different side channels in the system are being exploited by the attackers to bypass the protection mechanisms. Especially vulnerable with this regard is the traditional test and debug infrastructure placed on the System on Chips (SoC) which provides an alternative path into the chip internal structure. The aim of this paper is to present a comprehensive overview of various security aspects of SoCs including the known threat models, classification of attackers and existing techniques as well as present the solution concept for secure SoC Test Infrastructure with the focus on embedded cores testing.
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