{"title":"非易失性存储器的未来趋势","authors":"P. Suciu","doi":"10.1109/ISSCC.1987.1157075","DOIUrl":null,"url":null,"abstract":"Key areas to be assessed by the panelists are the merits of non-volatile memory techniques, tradeoffs between them and forecasts of trends in the next decade. Additionally, user and manufacturer panelists will probe the future of EPROMs, flash E2PROMs and E2PROMs.","PeriodicalId":102932,"journal":{"name":"1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Future trends in nonvolatile memories\",\"authors\":\"P. Suciu\",\"doi\":\"10.1109/ISSCC.1987.1157075\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Key areas to be assessed by the panelists are the merits of non-volatile memory techniques, tradeoffs between them and forecasts of trends in the next decade. Additionally, user and manufacturer panelists will probe the future of EPROMs, flash E2PROMs and E2PROMs.\",\"PeriodicalId\":102932,\"journal\":{\"name\":\"1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1987.1157075\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1987.1157075","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Key areas to be assessed by the panelists are the merits of non-volatile memory techniques, tradeoffs between them and forecasts of trends in the next decade. Additionally, user and manufacturer panelists will probe the future of EPROMs, flash E2PROMs and E2PROMs.