{"title":"HPEM环境下信息技术设备的故障与抗扰度极限","authors":"H. Sekiguchi, S. Seto, I. Minematsu","doi":"10.1109/EMCZUR.2009.4783392","DOIUrl":null,"url":null,"abstract":"This paper presents the investigation results of the relation with the malfunction and the immunity limit of an Ethernet hub that is put in the high-power electromagnetic (HPEM) environments. Several HPEM environments are built to induce the malfunction of the Ethernet hub. First, the radiated HPEM environments are built using a transverse electromagnetic (TEM) cell. Next, the conducted HPEM environment was built using a bulk current injection (BCI) method. From these test experiments, it is discussed on the relation with the malfunction and the immunity limit of the Ethernet hub.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"87 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"The Malfunction and Immunity limit of Information technology equipment under HPEM environments\",\"authors\":\"H. Sekiguchi, S. Seto, I. Minematsu\",\"doi\":\"10.1109/EMCZUR.2009.4783392\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the investigation results of the relation with the malfunction and the immunity limit of an Ethernet hub that is put in the high-power electromagnetic (HPEM) environments. Several HPEM environments are built to induce the malfunction of the Ethernet hub. First, the radiated HPEM environments are built using a transverse electromagnetic (TEM) cell. Next, the conducted HPEM environment was built using a bulk current injection (BCI) method. From these test experiments, it is discussed on the relation with the malfunction and the immunity limit of the Ethernet hub.\",\"PeriodicalId\":192851,\"journal\":{\"name\":\"2009 20th International Zurich Symposium on Electromagnetic Compatibility\",\"volume\":\"87 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-02-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 20th International Zurich Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCZUR.2009.4783392\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCZUR.2009.4783392","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Malfunction and Immunity limit of Information technology equipment under HPEM environments
This paper presents the investigation results of the relation with the malfunction and the immunity limit of an Ethernet hub that is put in the high-power electromagnetic (HPEM) environments. Several HPEM environments are built to induce the malfunction of the Ethernet hub. First, the radiated HPEM environments are built using a transverse electromagnetic (TEM) cell. Next, the conducted HPEM environment was built using a bulk current injection (BCI) method. From these test experiments, it is discussed on the relation with the malfunction and the immunity limit of the Ethernet hub.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
