逻辑表征车辆设计的自动化方法

Z. Liu, Ben Niewenhuis, Soumya Mittal, Phillip Fynan, R. D. Blanton
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引用次数: 0

摘要

卡内基梅隆大学的工程师们开发了一种新的类似产品的测试芯片,克服了目前传统测试芯片设计的局限性。本文讨论了称为CM-LCV的新芯片的优点,并提供了实验结果,显示了它如何实现与基准设计相当或更好的故障覆盖率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An Automated Methodology for Logic Characterization Vehicle Design
A new product-like test chip developed by engineers at Carnegie Mellon University overcomes the current limitations in conventional test chip design. This article discusses the advantages of the new chip, called the CM-LCV, and presents experimental results showing how it achieves fault coverages comparable to or better than benchmarking designs.
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