铅框LED封装中硫致光衰的失效模式及测试方法

G. Sun, Shasha Du, Youxing Yuan, Zhiping Zeng, J. G. Liu
{"title":"铅框LED封装中硫致光衰的失效模式及测试方法","authors":"G. Sun, Shasha Du, Youxing Yuan, Zhiping Zeng, J. G. Liu","doi":"10.1109/SSLCHINA.2015.7360694","DOIUrl":null,"url":null,"abstract":"Mid-power LED in a lead-frame package is the most commonly used LED for LCD backlighting and retrofit LED light source such as light bulb and linear light tube replacement. The lead-frame package consists silver plated copper and white plastic housing, both for the purpose of increasing light reflection. The silver can gradually become darkening when reacting with certain organics gas or chemical compounds, especially at high temperature and under light radiation. This resulted in light decay of LED product. Sulfur and its oxides are common pollutants in the atmosphere, which will form black silver sulfide with the silver plating. The blackening phenomenon is usually more severe in the silver layer of leadframe around the heat source, the LED chip where temperature and light radiation are highest. Even under the condition without light, samples after sulfur exposure treatment for only dozens of minutes will indicate obvious blackening phenomenon surrounding the LED chip.This paper will focus on the sulfur induced LED packaging failure. The failure mechanism of silver darkening will be discussed. Due to the lack of reliability test standard in a sulfur containing environment, it is hard to run an accelerated reliability test for a given condition. In this paper, we will try to develop a test method to effectively evaluate the susceptibility of a LED package to sulfur and to estimate its lumen reduction rate. Finally, we will give some recommendations for metal coating layer, encapsulant material, and surface treatment to reduce the sulfur impact. With a proper design, right material selection, and controlled temperature conditions, lead-frame LED package can be reliability used in most lighting fixtures and display applications.","PeriodicalId":331882,"journal":{"name":"2015 12th China International Forum on Solid State Lighting (SSLCHINA)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Failure mode and test method of sulfur induced light decay in lead-frame LED package\",\"authors\":\"G. Sun, Shasha Du, Youxing Yuan, Zhiping Zeng, J. G. Liu\",\"doi\":\"10.1109/SSLCHINA.2015.7360694\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Mid-power LED in a lead-frame package is the most commonly used LED for LCD backlighting and retrofit LED light source such as light bulb and linear light tube replacement. The lead-frame package consists silver plated copper and white plastic housing, both for the purpose of increasing light reflection. The silver can gradually become darkening when reacting with certain organics gas or chemical compounds, especially at high temperature and under light radiation. This resulted in light decay of LED product. Sulfur and its oxides are common pollutants in the atmosphere, which will form black silver sulfide with the silver plating. The blackening phenomenon is usually more severe in the silver layer of leadframe around the heat source, the LED chip where temperature and light radiation are highest. Even under the condition without light, samples after sulfur exposure treatment for only dozens of minutes will indicate obvious blackening phenomenon surrounding the LED chip.This paper will focus on the sulfur induced LED packaging failure. The failure mechanism of silver darkening will be discussed. Due to the lack of reliability test standard in a sulfur containing environment, it is hard to run an accelerated reliability test for a given condition. In this paper, we will try to develop a test method to effectively evaluate the susceptibility of a LED package to sulfur and to estimate its lumen reduction rate. Finally, we will give some recommendations for metal coating layer, encapsulant material, and surface treatment to reduce the sulfur impact. With a proper design, right material selection, and controlled temperature conditions, lead-frame LED package can be reliability used in most lighting fixtures and display applications.\",\"PeriodicalId\":331882,\"journal\":{\"name\":\"2015 12th China International Forum on Solid State Lighting (SSLCHINA)\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 12th China International Forum on Solid State Lighting (SSLCHINA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SSLCHINA.2015.7360694\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 12th China International Forum on Solid State Lighting (SSLCHINA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SSLCHINA.2015.7360694","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

引线框架封装的中功率LED是LCD背光和改装LED光源(如灯泡和线性灯管更换)最常用的LED。引线框架封装由镀银铜和白色塑料外壳组成,两者都是为了增加光反射。当与某些有机气体或化合物反应时,特别是在高温和光辐射下,银会逐渐变暗。这导致了LED产品的光衰减。硫及其氧化物是大气中常见的污染物,与镀银一起会形成黑色的硫化银。发黑现象通常在LED芯片温度和光辐射最高的光源周围引线框银层更为严重。即使在没有光线的情况下,经过硫暴露处理仅几十分钟的样品也会显示LED芯片周围有明显的发黑现象。本文将着重于硫磺引起的LED封装失效。讨论了银变黑的失效机理。由于缺乏含硫环境下的可靠性试验标准,很难对给定条件进行加速可靠性试验。在本文中,我们将尝试开发一种测试方法来有效评估LED封装对硫的敏感性并估计其流明减少率。最后,从金属涂层、封装材料、表面处理等方面提出减少硫影响的建议。通过适当的设计,正确的材料选择和控制的温度条件,引线框架LED封装可以可靠地用于大多数照明灯具和显示应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Failure mode and test method of sulfur induced light decay in lead-frame LED package
Mid-power LED in a lead-frame package is the most commonly used LED for LCD backlighting and retrofit LED light source such as light bulb and linear light tube replacement. The lead-frame package consists silver plated copper and white plastic housing, both for the purpose of increasing light reflection. The silver can gradually become darkening when reacting with certain organics gas or chemical compounds, especially at high temperature and under light radiation. This resulted in light decay of LED product. Sulfur and its oxides are common pollutants in the atmosphere, which will form black silver sulfide with the silver plating. The blackening phenomenon is usually more severe in the silver layer of leadframe around the heat source, the LED chip where temperature and light radiation are highest. Even under the condition without light, samples after sulfur exposure treatment for only dozens of minutes will indicate obvious blackening phenomenon surrounding the LED chip.This paper will focus on the sulfur induced LED packaging failure. The failure mechanism of silver darkening will be discussed. Due to the lack of reliability test standard in a sulfur containing environment, it is hard to run an accelerated reliability test for a given condition. In this paper, we will try to develop a test method to effectively evaluate the susceptibility of a LED package to sulfur and to estimate its lumen reduction rate. Finally, we will give some recommendations for metal coating layer, encapsulant material, and surface treatment to reduce the sulfur impact. With a proper design, right material selection, and controlled temperature conditions, lead-frame LED package can be reliability used in most lighting fixtures and display applications.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信