同步器阻性桥接缺陷分析

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI:10.1109/ATS.2009.13

Hyoung-Kook Kim, W. Jone, Laung-Terng Wang, Shianling Wu

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引用次数: 3

摘要

本文对由两个D触发器构成的同步器中的电阻性桥接缺陷进行了故障建模和分析。将桥接缺陷穷尽注入同步器的任意两个节点，找出同步器可能出现的所有故障，并使用HSPICE进行电路分析。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Analysis of Resistive Bridging Defects in a Synchronizer

This paper presents fault modeling and analysis for resistive bridging defects in a synchronizer constructed with two D flip-flops. Bridging defects are exhaustively injected into any two nodes of the synchronizer to find all possible faults that might occur in the synchronizer, and HSPICE is used to perform circuit analysis.

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来源期刊

2009 Asian Test Symposium

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