低功率测试双lfsr重播

2012 13th International Workshop on Microprocessor Test and Verification (MTV) Pub Date : 2012-12-10 DOI:10.1109/MTV.2012.15

Lung-Jen Lee, W. Tseng, Wenjie. Yang

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引用次数: 3

摘要

庞大的测试数据量和过高的测试功率是VLSI测试面临的两大严峻挑战。本文提出了一种采用双lfsr重播方法的BIST方案，在保持低扫描功率的同时有效地减少了测试数据量。实验结果表明，与同类工作相比，在扫描功率降低大致相等的情况下，测试数据量可以显著减少。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Dual-LFSR Reseeding for Low Power Testing

Large test data volume and excessive test power are two strict challenges for VLSI testing. This paper presents a BIST scheme adopting dual-LFSR reseeding method to effectively reduce the amount of test data while keeping the scan-in power as low. Experimental results show that, compared with the similar work, test data volume can be significantly reduced with a roughly equal scan-in power reduction.

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2012 13th International Workshop on Microprocessor Test and Verification (MTV)

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