{"title":"从透射电镜波导的散射响应估计介电介质的介电常数","authors":"I. Maio, P. Savi, F. Marino","doi":"10.1109/MMS.2009.5409775","DOIUrl":null,"url":null,"abstract":"This paper addresses the de-embedding of the propagation function of waveguides from the scattering responses of setups composed of TEM waguides terminated by launchers that introduce generic discontinuities. The de-embedding is aimed at estimating the permittivity of dielectric samples from the scattering responses of waveguides including the samples. The de-embedding is based on the double-delay method [2], that is applied to setups involving different launchers. A modified version of the method is also proposed to facilitate the measurement process.","PeriodicalId":300247,"journal":{"name":"2009 Mediterrannean Microwave Symposium (MMS)","volume":"105 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Estimation of the permittivity of dielectrics from the scattering responses of TEM waveguides\",\"authors\":\"I. Maio, P. Savi, F. Marino\",\"doi\":\"10.1109/MMS.2009.5409775\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper addresses the de-embedding of the propagation function of waveguides from the scattering responses of setups composed of TEM waguides terminated by launchers that introduce generic discontinuities. The de-embedding is aimed at estimating the permittivity of dielectric samples from the scattering responses of waveguides including the samples. The de-embedding is based on the double-delay method [2], that is applied to setups involving different launchers. A modified version of the method is also proposed to facilitate the measurement process.\",\"PeriodicalId\":300247,\"journal\":{\"name\":\"2009 Mediterrannean Microwave Symposium (MMS)\",\"volume\":\"105 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 Mediterrannean Microwave Symposium (MMS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MMS.2009.5409775\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Mediterrannean Microwave Symposium (MMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MMS.2009.5409775","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Estimation of the permittivity of dielectrics from the scattering responses of TEM waveguides
This paper addresses the de-embedding of the propagation function of waveguides from the scattering responses of setups composed of TEM waguides terminated by launchers that introduce generic discontinuities. The de-embedding is aimed at estimating the permittivity of dielectric samples from the scattering responses of waveguides including the samples. The de-embedding is based on the double-delay method [2], that is applied to setups involving different launchers. A modified version of the method is also proposed to facilitate the measurement process.