{"title":"聚合物薄膜电热击穿的计算","authors":"X. Qi, Z. Zheng, S. Boggs","doi":"10.1109/CEIDP.2003.1254862","DOIUrl":null,"url":null,"abstract":"Development of new polymer films is impeded by the need to make large quantities of high quality film for prototype devices. However, DC breakdown should be predictable from material electrothermal properties, i.e., field and temperature dependent electrical conductivity, thermal diffusivity, and boundary conditions. Transient nonlinear finite element analysis readily predicts thermal runaway of a polymer film between metal electrodes. In this contribution, we evaluate analytical approaches to this problem in the context of laboratory testing between metal electrodes. The objective is to predict approximate limits to device performance as a function of electric field and temperature from measurements on prototype materials.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Computation of electro-thermal breakdown of polymer films\",\"authors\":\"X. Qi, Z. Zheng, S. Boggs\",\"doi\":\"10.1109/CEIDP.2003.1254862\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Development of new polymer films is impeded by the need to make large quantities of high quality film for prototype devices. However, DC breakdown should be predictable from material electrothermal properties, i.e., field and temperature dependent electrical conductivity, thermal diffusivity, and boundary conditions. Transient nonlinear finite element analysis readily predicts thermal runaway of a polymer film between metal electrodes. In this contribution, we evaluate analytical approaches to this problem in the context of laboratory testing between metal electrodes. The objective is to predict approximate limits to device performance as a function of electric field and temperature from measurements on prototype materials.\",\"PeriodicalId\":306575,\"journal\":{\"name\":\"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-10-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.2003.1254862\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.2003.1254862","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Computation of electro-thermal breakdown of polymer films
Development of new polymer films is impeded by the need to make large quantities of high quality film for prototype devices. However, DC breakdown should be predictable from material electrothermal properties, i.e., field and temperature dependent electrical conductivity, thermal diffusivity, and boundary conditions. Transient nonlinear finite element analysis readily predicts thermal runaway of a polymer film between metal electrodes. In this contribution, we evaluate analytical approaches to this problem in the context of laboratory testing between metal electrodes. The objective is to predict approximate limits to device performance as a function of electric field and temperature from measurements on prototype materials.