{"title":"一种新型高集成度垂直结构TFT-CMOS逆变器,适用于低功耗应用","authors":"Min-Yan Lin, Jyi-Tsong Lin, Y. Lu","doi":"10.1109/ELECO.2013.6713869","DOIUrl":null,"url":null,"abstract":"In this paper, a novel vertical-like TFT-CMOS inverter with simple process and high integration density is proposed, which is composed of a pseudo-planar CMOS. Two compared devices are also designed for comparison, namely, the vertical complementary metal-oxide-semiconductor (VCMOS) and planar complementary metal-oxide-semiconductor (PCMOS). According to simulation results, the source overlap region is used to obtain a high drain saturation current, the drain underlap region is used to obtain a low Ioff, and the BOI is used to reduce the drain off-state current. we find out that the proposed approach achieves a 59.5% area reduction and significant shortening of wiring distance between the active devices when compared with existing planar CMOS technology.","PeriodicalId":108357,"journal":{"name":"2013 8th International Conference on Electrical and Electronics Engineering (ELECO)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A novel high integration-density TFT-CMOS inverter with vertical structure for low power application\",\"authors\":\"Min-Yan Lin, Jyi-Tsong Lin, Y. Lu\",\"doi\":\"10.1109/ELECO.2013.6713869\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a novel vertical-like TFT-CMOS inverter with simple process and high integration density is proposed, which is composed of a pseudo-planar CMOS. Two compared devices are also designed for comparison, namely, the vertical complementary metal-oxide-semiconductor (VCMOS) and planar complementary metal-oxide-semiconductor (PCMOS). According to simulation results, the source overlap region is used to obtain a high drain saturation current, the drain underlap region is used to obtain a low Ioff, and the BOI is used to reduce the drain off-state current. we find out that the proposed approach achieves a 59.5% area reduction and significant shortening of wiring distance between the active devices when compared with existing planar CMOS technology.\",\"PeriodicalId\":108357,\"journal\":{\"name\":\"2013 8th International Conference on Electrical and Electronics Engineering (ELECO)\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 8th International Conference on Electrical and Electronics Engineering (ELECO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ELECO.2013.6713869\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 8th International Conference on Electrical and Electronics Engineering (ELECO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELECO.2013.6713869","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A novel high integration-density TFT-CMOS inverter with vertical structure for low power application
In this paper, a novel vertical-like TFT-CMOS inverter with simple process and high integration density is proposed, which is composed of a pseudo-planar CMOS. Two compared devices are also designed for comparison, namely, the vertical complementary metal-oxide-semiconductor (VCMOS) and planar complementary metal-oxide-semiconductor (PCMOS). According to simulation results, the source overlap region is used to obtain a high drain saturation current, the drain underlap region is used to obtain a low Ioff, and the BOI is used to reduce the drain off-state current. we find out that the proposed approach achieves a 59.5% area reduction and significant shortening of wiring distance between the active devices when compared with existing planar CMOS technology.